© 2004

Infrared Ellipsometry on Semiconductor Layer Structures

Phonons, Plasmons, and Polaritons

  • Authors

Part of the Springer Tracts in Modern Physics book series (STMP, volume 209)

Table of contents

  1. Front Matter
  2. Mathias Schubert
    Pages 1-6
  3. Mathias Schubert
    Pages 7-29
  4. Mathias Schubert
    Pages 31-43
  5. Mathias Schubert
    Pages 45-65
  6. Mathias Schubert
    Pages 67-79
  7. Mathias Schubert
    Pages 81-107
  8. Mathias Schubert
    Pages 147-164
  9. Mathias Schubert
    Pages 165-167
  10. Mathias Schubert
    Pages 185-190
  11. Back Matter

About this book


The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects.

A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.


Anisotropy Blende Free-charge carriers HTS Infrared ellipsometry Polaritons Semiconductor ellipsometry spectroscopy

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