Dependable Computing - EDCC 5

5th European Dependable Computing Conference, Budapest, Hungary, April 20-22, 2005. Proceedings

  • Mario Dal Cin
  • Mohamed Kaâniche
  • András Pataricza
Conference proceedings EDCC 2005

Part of the Lecture Notes in Computer Science book series (LNCS, volume 3463)

Table of contents

  1. Front Matter
  2. Keynote I

    1. Pascal Traverse, Isabelle Lacaze, Jean Souyris
      Pages 1-1
  3. Session 1A: Distributed Algorithms

    1. Roy Friedman, Achour Mostefaoui, Michel Raynal
      Pages 2-19
    2. Josef Widder, Gérard Le Lann, Ulrich Schmid
      Pages 20-37
    3. Roberto Baldoni, Stefano Cimmino, Carlo Marchetti
      Pages 38-54
    4. Gildas Avoine, Felix Gärtner, Rachid Guerraoui, Marko Vukolić
      Pages 55-71
  4. Session 1B: Fault Tolerant Design and Protocols

    1. Sandeep S. Kulkarni, Ali Ebnenasir
      Pages 72-90
    2. Nithin Nakka, Giacinto Paolo Saggese, Zbigniew Kalbarczyk, Ravishankar K. Iyer
      Pages 103-121
    3. Dakai Zhu, Rami Melhem, Daniel Mossé
      Pages 122-139
  5. Session 2A: Practical Experience Reports and Tools I

    1. Christophe Honvault, Marc Le Roy, Pascal Gula, Jean Charles Fabre, Gérard Le Lann, Eric Bornschlegl
      Pages 140-153
    2. A. V. Singh, L. E. Moser, P. M. Melliar-Smith
      Pages 154-166
    3. Namyoon Woo, Hyungsoo Jung, Dongin Shin, Hyuck Han, Heon Y. Yeom, Taesoon Park
      Pages 167-178
  6. Session 2B: Assessment and Analysis

  7. Panel

  8. Keynote II

  9. Session 3A: Measurement

    1. David de Andrés, José Albaladejo, Lenin Lemus, Pedro Gil
      Pages 230-245
    2. Raul Barbosa, Jonny Vinter, Peter Folkesson, Johan Karlsson
      Pages 246-262

About these proceedings

Introduction

It is always a special honor to chair the European Dependable Computing C- ference (EDCC). EDCC has become one of the well-established conferences in the ?eld of dependability in the European research area. Budapest was selected as the host of this conference due to its traditions in organizing international scienti?c events and its traditional role of serving as a meeting point between East and West. EDCC-5 was the ?fth in the series of these high-quality scienti?c conf- ences. In addition to the overall signi?cance of such a pan-European event, this year’s conference was a special one due to historic reasons. The roots of EDCC date back to the moment when the Iron Curtain fell. Originally, two groups of scientists from di?erent European countries in Western and Eastern Europe – who were active in research and education related to dependability created a – joint forum in order to merge their communities as early as in 1989. This trend has continued up to today. This year’s conference was the ?rst one where the overwhelming majority of the research groups belong to the family of European nations united in the European Union. During the past 16 years we observed that the same roots in all the professional, cultural and scienti?c senses led to a seamless integration of these research communities previously separated ar- ?cially for a long time. EDCC has become one of the main European platforms to exchange new - searchideasinthe?eldofdependability.

Keywords

Fault-Tolerant Design Hardware QoS configuration dependable computing dependable systems distributed systems fault-tolerant computing hardware verification reactive systems reliable systems safety-critical systems security systems availability systems performance

Editors and affiliations

  • Mario Dal Cin
    • 1
  • Mohamed Kaâniche
    • 2
  • András Pataricza
    • 3
  1. 1.Institute for Computer Sciences IIIUniversity of Erlangen-NürnbergErlangenGermany
  2. 2.UPS, INSA, INP, ISAE; LAAS-CNRSUniversité de ToulouseToulouseFrance
  3. 3.Department of Measurement and Information SystemsBudapest University of Technology and Economics 

Bibliographic information

  • DOI https://doi.org/10.1007/b107276
  • Copyright Information Springer-Verlag Berlin Heidelberg 2005
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Computer Science
  • Print ISBN 978-3-540-25723-3
  • Online ISBN 978-3-540-32019-7
  • Series Print ISSN 0302-9743
  • Series Online ISSN 1611-3349
  • About this book
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