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Table of contents

  1. Front Matter
  2. N. S. Nogar, R. C. Dye, R. C. Estler, S. R. Foltyn, R. E. Muenchausen, X. D. Wu
    Pages 1-11
  3. C. H. Chen, R. C. Phillips, P. W. Morrison Jr., D. G. Hamblen, P. R. Solomon
    Pages 16-27
  4. Eric Fogarassy, C. Fuchs, A. Slaoui, J. P. Stoquert
    Pages 38-52
  5. M. J. Pellin, C. E. Young, W. F. Calaway, K. R. Lykke, P. Wurz, D. M. Gruen et al.
    Pages 61-67
  6. W. Hoheisel, M. Vollmer, F. Träger
    Pages 77-81
  7. E. T. Arakawa, I. Lee, T. A. Callcottt
    Pages 82-86
  8. P. D. Brewer, J. J. Zinck, G. L. Olson
    Pages 96-105
  9. Alexander A. Oraevsky, Rinat O. Esenaliev, Vladilen S. Letokhov
    Pages 112-122
  10. Claus Köster, Josef Lindner, Gary R. Kinsel, Jürgen Grotemeyer
    Pages 137-148
  11. Brian T. Chait, Ronald C. Beavis
    Pages 149-153
  12. Peter Williams, David Schieltz, Cong-Wen Luo, Robert M. Thomas, Randall W. Nelson
    Pages 154-159
  13. J. Paul Speir, Greg S. Gorman, I. Jonathan Amster
    Pages 174-179
  14. R. S. Dingus, R. J. Scammon
    Pages 180-190
  15. L. L. Chase, A. V. Hamza, H. W. H. Lee
    Pages 191-202
  16. Noriaki Itoh, Ken Hattori, Yasuo Nakai, Jyun'ichi Kanasaki, Akiko Okano, Richard F. Haglund Jr.
    Pages 213-223
  17. Guillaume Petite, Philippe Martin, Rusty Trainham, Pierre Agostini, Stephane Guizard, Francois Jollet et al.
    Pages 224-233
  18. R. H. Ritchie, J. R. Manson, P. M. Echenique
    Pages 239-245
  19. Richard F. Haglund Jr., Mario Affatigato, James Arps, Kai Tang
    Pages 246-249
  20. A. C. Tam, W. P. Leung, D. Krajnovich
    Pages 260-262
  21. M. M. Bialkowski, G. S. Hurst, J. E. Parks, D. H. Lowndes, G. E. Jellison Jr.
    Pages 263-270
  22. M. S. Donley, J. S. Zabinski, V. J. Dyhouse, P. J. John, P. T. Murray, N. T. McDevitt
    Pages 271-279
  23. R. L. Hettich, R. N. Compton, R. H. Ritchie
    Pages 285-293
  24. I. Lee, E. T. Arakawa, T. A. Callcott
    Pages 297-300
  25. David P. Norton, Douglas H. Lowndes, X. Zheng, R. J. Warmack, S. J. Pennycook, J. D. Budai
    Pages 311-319
  26. Mark A. Shannon, Ali A. Rostami, Richard E. Russo
    Pages 320-327
  27. Bobby G. Sumpter, Donald W. Noid, Bernhard Wunderlich
    Pages 334-343
  28. Lawrence Wiedeman, HyunSook Kima, Henry Helvajianb
    Pages 350-359

About these proceedings

Introduction

Lasers can readily remove very thin layers from small areas of a material and can thus be used both to control the structure of the surface and to determine its composition. Laser ablation thus has a wide variety of applications - from re-shaping the cornea of the eye to correct vision and micro-machining electronic devices, to detection of minute contaminants on catalysts. This book is the proceedings of one ofthe first workshops held on this topic.

Keywords

Continuous wave Elektronik Festkörperphysik Film dynamics electronic device laser materials science solid-state spectroscopy surface analysis surfaces

Bibliographic information

  • DOI https://doi.org/10.1007/BFb0048346
  • Copyright Information Springer-Verlag 1991
  • Publisher Name Springer, New York, NY
  • eBook Packages Springer Book Archive
  • Print ISBN 978-0-387-97731-7
  • Online ISBN 978-0-387-34818-6
  • Series Print ISSN 0075-8450
  • Series Online ISSN 1616-6361
  • Buy this book on publisher's site
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