Progress in Nanoscale Characterization and Manipulation

  • Rongming Wang
  • Chen Wang
  • Hongzhou Zhang
  • Jing Tao
  • Xuedong Bai

Part of the Springer Tracts in Modern Physics book series (STMP, volume 272)

Table of contents

  1. Front Matter
    Pages i-vii
  2. Jing Tao, Rongming Wang, Hongzhou Zhang
    Pages 1-33
  3. Wei Han, Huisheng Jiao, Daniel Fox
    Pages 35-68
  4. Rongming Wang, Jing Tao, Kui Du, Yumei Wang, Binghui Ge, Fanghua Li et al.
    Pages 69-203
  5. Zhihua Zhang, Yonghai Yue, Jiaqing He
    Pages 255-299
  6. Kun Zheng, Yihua Gao, Xuedong Bai, Renchao Che, Ze Zhang, Xiaodong Han et al.
    Pages 381-477
  7. Daniel Fox, Hongzhou Zhang
    Pages 479-508

About this book


This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.

The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.


Electron/Ion Optics Charged-particle microscopy Scanning Electron Microscopy Transmission Electron Microscopy Aberration Corrected Transmission Electron Microscopy In situ TEM Helium Ion Microscopy Electron Microanalysis

Editors and affiliations

  • Rongming Wang
    • 1
  • Chen Wang
    • 2
  • Hongzhou Zhang
    • 3
  • Jing Tao
    • 4
  • Xuedong Bai
    • 5
  1. 1.School of Mathematics and PhysicsUniversity of Science and Technology BeijingBeijingChina
  2. 2.National Center for Nanoscience TechnologyBeijingChina
  3. 3.CRANN and AMBER, Trinity College DublinUniversity of DublinDublinIreland
  4. 4.Department of Condensed Matter Physics and Materials ScienceBrookhaven National LaboratoryNew YorkUSA
  5. 5.Institute of PhysicsChinese Academy of SciencesBeijingChina

Bibliographic information

  • DOI
  • Copyright Information Peking University Press and Springer Nature Singapore Pte Ltd. 2018
  • Publisher Name Springer, Singapore
  • eBook Packages Physics and Astronomy
  • Print ISBN 978-981-13-0453-8
  • Online ISBN 978-981-13-0454-5
  • Series Print ISSN 0081-3869
  • Series Online ISSN 1615-0430
  • Buy this book on publisher's site
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