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© 2017

VLSI Design and Test

21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers

  • Brajesh Kumar Kaushik
  • Sudeb Dasgupta
  • Virendra Singh
Conference proceedings VDAT 2017

Part of the Communications in Computer and Information Science book series (CCIS, volume 711)

Table of contents

  1. Front Matter
    Pages I-XXI
  2. Digital Design

    1. Front Matter
      Pages 1-1
    2. M. Mohamed Asan Basiri, Sandeep K. Shukla
      Pages 3-14
    3. K. Dheepika, K. S. Jevasankari, Vippin Chandhar, Binsu J. Kailath
      Pages 36-47
    4. Pravin Zode, R. B. Deshmukh, Abdus Samad
      Pages 48-55
    5. Jatindeep Singh, Satyajit Mohapatra, Nihar Ranjan Mohapatra
      Pages 56-61
    6. Moumita Das, Ansuman Banerjee, Bhaskar Sardar
      Pages 69-74
    7. Thilagavathy R, Susmitha Settivari, Venkataramani B, Bhaskar M
      Pages 75-80
  3. Analog/Mixed Signal

    1. Front Matter
      Pages 81-81
    2. Naresh Kumar, Raja Hari Gudlavalleti, Subash Chandra Bose
      Pages 93-102
    3. M. Santosh, Anjli Bansal, Jitendra Mishra, K. C. Behra, S. C. Bose
      Pages 115-126
    4. Ashok Ray, Gaurav Kumar, Sushanta Bordoloi, Dheeraj Kumar Sinha, Pratima Agarwal, Gaurav Trivedi
      Pages 127-135
    5. Vivek Tyagi, M. S. Hashmi, Ganesh Raj, Vikas Rana
      Pages 144-152
  4. VLSI Testing

    1. Front Matter
      Pages 153-153

About these proceedings

Introduction

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

Keywords

Analog/Mixed Signal Architecture and CAD Circuits Design Verification Devices and Technology – I Devices and Technology – II Digital circuits Digital design Embedded systems Emerging Technologies and Memory Low Power Design and Test Multi-processor architectures Network-on-chip RF Circuits SRAM arrays System Design Testing and verification VLSI Architectures VLSI design VLSI Testing

Editors and affiliations

  • Brajesh Kumar Kaushik
    • 1
  • Sudeb Dasgupta
    • 2
  • Virendra Singh
    • 3
  1. 1.Indian Institute of Technology RoorkeeRoorkeeIndia
  2. 2.Indian Institute of Technology RoorkeeRoorkeeIndia
  3. 3.Indian Institute of Technology BombayMumbaiIndia

Bibliographic information

  • Book Title VLSI Design and Test
  • Book Subtitle 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers
  • Editors Brajesh Kumar Kaushik
    Sudeb Dasgupta
    Virendra Singh
  • Series Title Communications in Computer and Information Science
  • Series Abbreviated Title Communic.Comp.Inf.Science
  • DOI https://doi.org/10.1007/978-981-10-7470-7
  • Copyright Information Springer Nature Singapore Pte Ltd. 2017
  • Publisher Name Springer, Singapore
  • eBook Packages Computer Science Computer Science (R0)
  • Softcover ISBN 978-981-10-7469-1
  • eBook ISBN 978-981-10-7470-7
  • Series ISSN 1865-0929
  • Series E-ISSN 1865-0937
  • Edition Number 1
  • Number of Pages XXI, 815
  • Number of Illustrations 486 b/w illustrations, 0 illustrations in colour
  • Topics Computer Hardware
    Processor Architectures
    Computer Communication Networks
  • Buy this book on publisher's site
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