© 1993

Near Field Optics

  • Dieter W. Pohl
  • Daniel Courjon

Part of the NATO ASI Series book series (NSSE, volume 242)

Table of contents

  1. Front Matter
    Pages i-xiv
  2. Introduction

  3. Screened Tip Techniques

    1. Raoul Kopelman, Weihong Tan, Zhong-You Shi, Duane Birnbaum
      Pages 17-24
    2. T. Hartmann, R. Gatz, W. Wiegräbe, A. Kramer, A. Hillebrand, K. Lieberman et al.
      Pages 35-44
    3. D. W. Pohl, D. Courjon, C. Bainier, A. Dereux, H. Heinzelmann
      Pages 51-58
  4. Unscreened Tip Techniques

  5. Optical Forces

    1. Othmar Marti, Victor I. Balykin
      Pages 121-130
    2. M. Ohtsu, S. Jiang, T. Pangaribuan, M. Kozuma
      Pages 131-139
    3. Lars Malmqvist, Hans M. Hertz
      Pages 141-146
  6. Theory

    1. J. P. Vigneron
      Pages 147-156
    2. D. van Labeke, D. Barchiesi
      Pages 157-178

About this book


Scanning near-field optical microscopy (SNOM, also known as NSOM) is a new local probe technique with a resolving power of 10--50 nm. Not being limited by diffraction, near-field optics (NFO) opens new perspectives for optical characterization and the understanding of optical phenomena, in particular in biology, microelectronics and materials science.
SNOM, after first demonstrations in '83/'84, has undergone a rapid development in the past two to four years. The increased interest has been largely stimulated by the wealth of optical properties that can be investigated and the growing importance of characterization on the nanometer scale in general. Examples include the use of fluorescence, birefrigence and plasmon effects for applications in particular in biology, microelectronics and materials science, to name just a few.
This volume emerged from the first international meeting devoted exclusively to NFO, and comprises a complete survey of the 1992 activities in the field, in particular the variety of instrumental techniques that are currently being explored, the demonstration of the imaging capabilities as well as theoretical interpretations - a highly nontrivial task. The comprehensive collection of papers devoted to these and related subjects make the book a valuable tool for anybody interested in near-field optics.


Apertur diffraction imaging microscopy optical properties optics

Editors and affiliations

  • Dieter W. Pohl
    • 1
  • Daniel Courjon
    • 2
  1. 1.IBM Research DivisionZurich Research LaboratoryRüschlikonSwitzerland
  2. 2.Laboratoire d’Optique P.M. DuffieuxUniversité de Franche-ComtéBesançonFrance

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