Semiconductor Device Reliability

  • A. Christou
  • B. A. Unger

Part of the NATO ASI Series book series (NSSE, volume 175)

Table of contents

  1. Front Matter
    Pages i-ix
  2. Reliability Testing

  3. Reliability Models and Failure Mechanisms

  4. Failure Analysis

    1. R. G. Taylor, J. A. Hughes
      Pages 161-175
    2. Fabrizio Magistrali, Carlo Tedesco, Enrico Zanoni
      Pages 211-267
    3. G. Kiriakidis, W. T. Anderson, Z. Hatzopoulos, C. Michelakis, D. V. Morgan
      Pages 269-289
  5. Opto-Electronic Reliability (I)

    1. T. Ikegami, M. Fukuda, M. Suzuki
      Pages 321-328
    2. K. Mizuishi, T. Kato, H. Inoue, H. Ishida
      Pages 329-342
    3. A. R. Goodwin, J. E. A. Whiteaway, R. H. Murphy
      Pages 343-352
  6. Opto-Electronic Reliability (II)

    1. P. Su, B. A. Unger
      Pages 363-378
    2. Louis F. Dechiaro, Carmen D. Brick-Rodriguez, Robert G. Chemelli, John W. Krupsky
      Pages 379-411
    3. Masahiro Kobayashi, Takao Kaneda
      Pages 413-421
  7. Compound Semiconductor Reliability

    1. W. T. Anderson, A. Christou
      Pages 423-437
    2. B. Riccò, F. Fantini, F. Magistrali, P. Brambilla
      Pages 455-469
    3. William O. Camp Jr., Randall Lasater, Vincent Genova, Robert Hume
      Pages 471-477
  8. High-Speed Circuit Reliability

  9. Back Matter
    Pages 569-575

About this book


This publication is a compilation of papers presented at the Semiconductor Device Reliabi­ lity Workshop sponsored by the NATO International Scientific Exchange Program. The Workshop was held in Crete, Greece from June 4 to June 9, 1989. The objective of the Workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices. The primary support for the meeting was provided by the Scientific Affairs Division of NATO. We are indebted to NATO for their support and to Dr. Craig Sinclair, who admin­ isters this program. The chapters of this book follow the format and order of the sessions of the meeting. Thirty-six papers were presented and discussed during the five-day Workshop. In addi­ tion, two panel sessions were held, with audience participation, where the particularly controversial topics of bum-in and reliability modeling and prediction methods were dis­ cussed. A brief review of these sessions is presented in this book.


ASIC CMOS LED Laser Standard Transistor VLSI integrated circuit

Editors and affiliations

  • A. Christou
    • 1
  • B. A. Unger
    • 2
  1. 1.Surface Physics BranchNaval Research LaboratoryUSA
  2. 2.Bell Communications ResearchRed BankUSA

Bibliographic information

  • DOI
  • Copyright Information Springer Science+Business Media B.V. 1990
  • Publisher Name Springer, Dordrecht
  • eBook Packages Springer Book Archive
  • Print ISBN 978-94-010-7620-3
  • Online ISBN 978-94-009-2482-6
  • Series Print ISSN 0168-132X
  • Buy this book on publisher's site
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