© 2011

Accelerating Test, Validation and Debug of High Speed Serial Interfaces


Table of contents

  1. Front Matter
    Pages i-xii
  2. Yongquan Fan, Zeljko Zilic
    Pages 1-10
  3. Yongquan Fan, Zeljko Zilic
    Pages 11-35
  4. Yongquan Fan, Zeljko Zilic
    Pages 37-85
  5. Yongquan Fan, Zeljko Zilic
    Pages 87-119
  6. Yongquan Fan, Zeljko Zilic
    Pages 121-147
  7. Yongquan Fan, Zeljko Zilic
    Pages 149-178
  8. Yongquan Fan, Zeljko Zilic
    Pages 179-181
  9. Back Matter
    Pages 183-194

About this book


High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive instruments. Accelerating Test, Validation and Debug of High Speed Serial Interfaces provides innovative test and debug approaches and detailed instructions on how to arrive to practical test of modern high-speed interfaces.

Accelerating Test, Validation and Debug of High Speed Serial Interfaces first proposes a new algorithm that enables us to perform receiver test more than 1000 times faster. Then an under-sampling based transmitter test scheme is presented. The scheme can accurately extract the transmitter jitter and finish the whole transmitter test within 100ms, while the test usually takes seconds. The book also presents and external loopback-based testing scheme, where and FPGA-based BER tester and a novel jitter injection technique are proposed. These schemes can be applied to validate, test and debug HSSIs with data rate up to 12.5Gbps at a lower test cost than pure ATE solutions. In addition, the book introduces an efficieng scheme to implement high performance Gaussian noise generators, suitable for evaluating BER performance under noise conditions.


Bit error rate testing Circuit Desnign Debugging Electronic Design Automation Electronic Testing High-speed serial interfaces Jitter injection and characterization Mixed-signal testing Verification & Validation

Authors and affiliations

  1. 1.High Performance AnalogTexas InstrumentsDallasUSA
  2. 2.Dept. Electrical & Computer EngineeringMcGill UniversityMontrealCanada

About the authors

Yongquan Fan is a Senior Test Engineer in the High Performance Analog group at Texas Instruments. He had been a Senior Staff Engineer in the Storage Peripheral Group at LSI Corporation from 2003~2008. From 1991 to 2000, he worked for Sichuan Changhong Electronic Incorporation, China. Yongquan Fan obtained his Ph.D and MENG degree from McGill University, Canada and his BS from Beijing University of Aeronautics and Astronautics, China, all in Electrical Engineering.

Zeljko Zilic received his Ph. D. and M. Sc. from the University of Toronto, and his B. Eng. from University of Zagreb, Croatia. From 1996 till 1997 he worked for Lucent Microelectronics. He joined McGill University in 1998, where he is now an Associate Professor. Prof. Zilic has used a sabbatical leave in 2004/2005 to work with ST Microelectronics in Ottawa. He has received two Best Paper Awards and several honorary mentions from international conferences, as well as a national teaching award in Canada.

Bibliographic information

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