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Magnetic Resonance of Semiconductors and Their Nanostructures

Basic and Advanced Applications

  • Pavel G. Baranov
  • Hans Jürgen von Bardeleben
  • Fedor Jelezko
  • Jörg Wrachtrup

Part of the Springer Series in Materials Science book series (SSMATERIALS, volume 253)

Table of contents

  1. Front Matter
    Pages i-xv
  2. Pavel G. Baranov, Hans Jürgen von Bardeleben, Fedor Jelezko, Jörg Wrachtrup
    Pages 1-111
  3. Pavel G. Baranov, Hans Jürgen von Bardeleben, Fedor Jelezko, Jörg Wrachtrup
    Pages 113-178
  4. Pavel G. Baranov, Hans Jürgen von Bardeleben, Fedor Jelezko, Jörg Wrachtrup
    Pages 179-211
  5. Pavel G. Baranov, Hans Jürgen von Bardeleben, Fedor Jelezko, Jörg Wrachtrup
    Pages 213-355
  6. Pavel G. Baranov, Hans Jürgen von Bardeleben, Fedor Jelezko, Jörg Wrachtrup
    Pages 357-433
  7. Pavel G. Baranov, Hans Jürgen von Bardeleben, Fedor Jelezko, Jörg Wrachtrup
    Pages 435-518
  8. Back Matter
    Pages 519-524

About this book

Introduction

This book explains different magnetic resonance (MR) techniques and uses different combinations of these techniques to analyze defects in semiconductors and nanostructures. It also introduces novelties such as single defects MR and electron-paramagnetic-resonance-based methods: electron spin echo, electrically detected magnetic resonance, optically detected magnetic resonance and electron-nuclear double resonance – the designated tools for investigating the structural and spin properties of condensed systems, living matter, nanostructures and nanobiotechnology objects. Further, the authors address problems existing in semiconductor and nanotechnology sciences that can be resolved using MR, and discuss past, current and future applications of MR, with a focus on advances in MR methods.

The book is intended for researchers in MR studies of semiconductors and nanostructures wanting a comprehensive review of what has been done in their own and related fields of study, as well as future perspectives.

Keywords

Electron Nuclear Double Resonance Electron Paramagnetic Resonance Electron Spin Echo Optically Detected Magnetic Resonance cyclotron resonance magnetic resonance applications nanostructure defects detection semiconductor defects solid state physics and magnetic resonance

Authors and affiliations

  • Pavel G. Baranov
    • 1
  • Hans Jürgen von Bardeleben
    • 2
  • Fedor Jelezko
    • 3
  • Jörg Wrachtrup
    • 4
  1. 1.Laboratory of Microwave Spectroscopy of CrystalsIoffe InstituteSt. PetersburgRussia
  2. 2.Institut des Nanosciences de Paris-INSPUniversité Pierre et Marie Curie and UMR 7588 au CNRSParisFrance
  3. 3.Institut für QuantenoptikUniversität UlmUlmGermany
  4. 4.Physikalisches InstitutUniversität StuttgartStuttgartGermany

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-7091-1157-4
  • Copyright Information Springer-Verlag GmbH Austria 2017
  • Publisher Name Springer, Vienna
  • eBook Packages Physics and Astronomy
  • Print ISBN 978-3-7091-1156-7
  • Online ISBN 978-3-7091-1157-4
  • Series Print ISSN 0933-033X
  • Series Online ISSN 2196-2812
  • Buy this book on publisher's site
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