Scanning Probe Microscopy

1. Atomic Force Microscopy (AFM)

   1. Noise in Atomic Force Microscopy

      • Bert Voigtländer

      Pages 255-267

   2. Quartz Sensors in Atomic Force Microscopy

      • Bert Voigtländer

      Pages 269-275

2. Scanning Tunneling Microscopy and Spectroscopy

   1. Front Matter

      Pages 277-277

      PDF

   2. Scanning Tunneling Microscopy

      • Bert Voigtländer

      Pages 279-308

   3. Scanning Tunneling Spectroscopy (STS)

      • Bert Voigtländer

      Pages 309-334

   4. Vibrational Spectroscopy with the STM

      • Bert Voigtländer

      Pages 335-340

   5. Spectroscopy and Imaging of Surface States

      • Bert Voigtländer

      Pages 341-347

   6. Building Nanostructures Atom by Atom

      • Bert Voigtländer

      Pages 349-357

3. Back Matter

   Pages 359-382

   PDF

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

• Atomic Force Microscopy
• Non-contact Atomic Force Microscopy
• Scanning Probe Microscopy
• Scanning Tunneling Microscopy
• Scanning Tunneling Spectroscopy

“The book attempts to provide a technical, theoretical, and conceptual framework to understand how SPM works and what can be done with it so that a reader wishing to further learn about newer topics will have the basis to do so. This book could thus serve as a useful reference and textbook for anyone desiring an advanced introduction to the fascinating world of SPM.” (Sidney Cohen, MRS Bulletin, Vol. 41, February, 2016)

“The contents of this book are presented in a very clear didactic manner ... . In addition, it includes the foundations of many technical aspects that are not necessarily a part of the methods themselves, but which in practice are required for the application. ... What I particularly like, is the fact that it discusses common artefacts occurring in scanning tunneling microscopy. Such discussions are rare in the literature, although they are essential for a complete training of young scientists. To my mind the book is well suited not only for physicists, but also for chemists, materials and nano-scientists and others with similar background.” (Quote translated from German, Jascha Repp, Physik Journal, issue 4, 2016)  

    

• Forschungszentrum Jülich, Peter Grünberg Institut (PGI-3) and RWTH—Aachen University, Lehrstuhl für Experimentalphysik IVA, Aachen, Germany, Jülich, Germany

  Bert Voigtländer

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

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