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© 2015

Scanning Probe Microscopy

Atomic Force Microscopy and Scanning Tunneling Microscopy

  • Presents the state-of-the-art in scanning probe techniques

  • Combines basic physical principles and their application to scanning tunneling and atomic force microscopes

  • Useful study text for graduate students and also useful reference to researchers

Book

Part of the NanoScience and Technology book series (NANO)

Table of contents

  1. Front Matter
    Pages i-xv
  2. Bert Voigtländer
    Pages 1-11
  3. Scanning Probe Microscopy Instrumentation

    1. Front Matter
      Pages 13-13
    2. Bert Voigtländer
      Pages 15-29
    3. Bert Voigtländer
      Pages 31-63
    4. Bert Voigtländer
      Pages 65-76
    5. Bert Voigtländer
      Pages 77-99
    6. Bert Voigtländer
      Pages 101-105
    7. Bert Voigtländer
      Pages 107-114
    8. Bert Voigtländer
      Pages 115-121
    9. Bert Voigtländer
      Pages 135-141
  4. Atomic Force Microscopy (AFM)

    1. Front Matter
      Pages 143-143
    2. Bert Voigtländer
      Pages 145-155
    3. Bert Voigtländer
      Pages 157-175
    4. Bert Voigtländer
      Pages 177-186
    5. Bert Voigtländer
      Pages 205-221

About this book

Introduction

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

Keywords

Atomic Force Microscopy Non-contact Atomic Force Microscopy Scanning Probe Microscopy Scanning Tunneling Microscopy Scanning Tunneling Spectroscopy

Authors and affiliations

  1. 1.Forschungszentrum Jülich, Peter Grünberg Institut (PGI-3) and RWTH—Aachen University, Lehrstuhl für Experimentalphysik IVA, Aachen, GermanyJülichGermany

About the authors

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

Bibliographic information

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Reviews

“The book attempts to provide a technical, theoretical, and conceptual framework to understand how SPM works and what can be done with it so that a reader wishing to further learn about newer topics will have the basis to do so. This book could thus serve as a useful reference and textbook for anyone desiring an advanced introduction to the fascinating world of SPM.” (Sidney Cohen, MRS Bulletin, Vol. 41, February, 2016)

“The contents of this book are presented in a very clear didactic manner ... . In addition, it includes the foundations of many technical aspects that are not necessarily a part of the methods themselves, but which in practice are required for the application. ... What I particularly like, is the fact that it discusses common artefacts occurring in scanning tunneling microscopy. Such discussions are rare in the literature, although they are essential for a complete training of young scientists. To my mind the book is well suited not only for physicists, but also for chemists, materials and nano-scientists and others with similar background.” (Quote translated from German, Jascha Repp, Physik Journal, issue 4, 2016)