Transmission Electron Microscopy

Physics of Image Formation and Microanalysis

  • Ludwig Reimer

Part of the Springer Series in Optical Sciences book series (SSOS, volume 36)

Table of contents

  1. Front Matter
    Pages I-XIII
  2. Ludwig Reimer
    Pages 1-18
  3. Ludwig Reimer
    Pages 19-49
  4. Ludwig Reimer
    Pages 50-85
  5. Ludwig Reimer
    Pages 136-191
  6. Ludwig Reimer
    Pages 375-430
  7. Ludwig Reimer
    Pages 431-463
  8. Back Matter
    Pages 465-546

About this book


"Transmission Electron Microscopy" presents the theory of image and contrastformation, and the analytical modes in transmission electron microscopy. Theprinciples of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also analysed are the kinetical and dynamical theories of electron diffraction and their applications for crystal-structure determination and imaging of lattices and their defects. X-ray microanalysis and electron energy-loss spectroscopy are treated as analytical methods. The third edition includes a brief discussionof Schottky emission guns, some clarification of minor details, and references to the recent literature.


Electron Microscopes Electron and Ion Emission Materials Science crystal diffraction electron electron diffraction electron microscope electron microscopy material materials science microscopy optics physics scattering spectroscopy structure transmission electron microscopy

Authors and affiliations

  • Ludwig Reimer
    • 1
  1. 1.Physikalisches InstitutWestfälische Wilhelms-Universität MünsterMünsterGermany

Bibliographic information

  • DOI
  • Copyright Information Springer-Verlag Berlin Heidelberg 1993
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-540-56849-0
  • Online ISBN 978-3-662-21556-2
  • Series Print ISSN 0342-4111
  • Series Online ISSN 1556-1534
  • Buy this book on publisher's site
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