Transmission Electron Microscopy

Physics of Image Formation and Microanalysis

  • Ludwig Reimer

Part of the Springer Series in Optical Sciences book series (SSOS, volume 36)

Table of contents

  1. Front Matter
    Pages III-XII
  2. Ludwig Reimer
    Pages 1-18
  3. Ludwig Reimer
    Pages 19-49
  4. Ludwig Reimer
    Pages 50-85
  5. Ludwig Reimer
    Pages 135-184
  6. Ludwig Reimer
    Pages 365-420
  7. Ludwig Reimer
    Pages 421-453
  8. Back Matter
    Pages 455-524

About this book


The aim of this book is to outline the physics of image formation, electron­ specimen interactions and image interpretation in transmission electron mic­ roscopy. The book evolved from lectures delivered at the University of Munster and is a revised version of the first part of my earlier book Elek­ tronenmikroskopische Untersuchungs- und Priiparationsmethoden, omitting the part which describes specimen-preparation methods. In the introductory chapter, the different types of electron microscope are compared, the various electron-specimen interactions and their applications are summarized and the most important aspects of high-resolution, analytical and high-voltage electron microscopy are discussed. The optics of electron lenses is discussed in Chapter 2 in order to bring out electron-lens properties that are important for an understanding of the function of an electron microscope. In Chapter 3, the wave optics of elec­ trons and the phase shifts by electrostatic and magnetic fields are introduced; Fresnel electron diffraction is treated using Huygens' principle. The recogni­ tion that the Fraunhofer-diffraction pattern is the Fourier transform of the wave amplitude behind a specimen is important because the influence of the imaging process on the contrast transfer of spatial frequencies can be described by introducing phase shifts and envelopes in the Fourier plane. In Chapter 4, the elements of an electron-optical column are described: the electron gun, the condenser and the imaging system. A thorough understanding of electron-specimen interactions is essential to explain image contrast.


Elektronenmikroskopie crystal damage diffraction electron electron diffraction electron microscope electron microscopy formation microscopy scattering transmission electron microscopy

Authors and affiliations

  • Ludwig Reimer
    • 1
  1. 1.Physikalisches InstitutWestfälische Wilhelms-Universität MünsterMünsterFed. Rep. of Germany

Bibliographic information

  • DOI
  • Copyright Information Springer-Verlag Berlin Heidelberg 1984
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-662-13555-6
  • Online ISBN 978-3-662-13553-2
  • Series Print ISSN 0342-4111
  • Series Online ISSN 1556-1534
  • Buy this book on publisher's site