Overview
- The diffraction analysis is a powerful tool to characterize the microstructure, dislocations, interfaces and surfaces of microstructured materials and thin films.
- This book presents the method, theory and application of diffraction analysis
Part of the book series: Springer Series in Materials Science (SSMATERIALS, volume 68)
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Table of contents (20 chapters)
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Surface and Interface Effects
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Front Matter
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Microstructural Gradients; Thin Films
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Front Matter
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Back Matter
Keywords
About this book
Diffraction Analysis of the Microstructure of Materials provides an overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.
Editors and Affiliations
Bibliographic Information
Book Title: Diffraction Analysis of the Microstructure of Materials
Editors: Eric J. Mittemeijer, Paolo Scardi
Series Title: Springer Series in Materials Science
DOI: https://doi.org/10.1007/978-3-662-06723-9
Publisher: Springer Berlin, Heidelberg
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eBook Packages: Springer Book Archive
Copyright Information: Springer-Verlag Berlin Heidelberg 2004
Hardcover ISBN: 978-3-540-40519-1Published: 26 November 2003
Softcover ISBN: 978-3-642-07352-6Published: 15 December 2010
eBook ISBN: 978-3-662-06723-9Published: 21 November 2013
Series ISSN: 0933-033X
Series E-ISSN: 2196-2812
Edition Number: 1
Number of Pages: XXV, 554
Topics: Condensed Matter Physics, Nanotechnology, Characterization and Evaluation of Materials, Surfaces and Interfaces, Thin Films, Crystallography and Scattering Methods, Engineering, general
Industry Sectors: Electronics, Energy, Utilities & Environment