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Transmission Electron Microscopy and Diffractometry of Materials

  • Textbook
  • © 2001

Overview

Authors:
  1. Brent Fultz

    1. Division of Engineering and Applied Science, California Institute of Technology, Pasadena, USA

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  2. James M. Howe

    1. Department of Materials Science and Engineering, University of Virginia, Charlottesville, USA

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    You can also search for this author in PubMed   Google Scholar

  • Designed to meet the needs of materials scientists, including students, teachers and researchers
  • It can be used as both an introductory and advanced level graduate text
  • Chapters are sorted according to difficulty and grouped for use in quarter and semester courses
  • Problems for the student are appended to each chapter
  • Includes supplementary material: sn.pub/extras

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Table of contents (11 chapters)

  1. Front Matter

    Pages I-XIX
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  2. Diffraction and the X-Ray Powder Diffractometer

    • Brent Fultz, James M. Howe
    Pages 1-61

  3. The TEM and its Optics

    • Brent Fultz, James M. Howe
    Pages 63-121

  4. Scattering

    • Brent Fultz, James M. Howe
    Pages 123-166

  5. Inelastic Electron Scattering and Spectroscopy

    • Brent Fultz, James M. Howe
    Pages 167-224

  6. Diffraction from Crystals

    • Brent Fultz, James M. Howe
    Pages 225-274

  7. Electron Diffraction and Crystallography

    • Brent Fultz, James M. Howe
    Pages 275-337

  8. Diffraction Contrast in TEM Images

    • Brent Fultz, James M. Howe
    Pages 339-422

  9. Diffraction Lineshapes

    • Brent Fultz, James M. Howe
    Pages 423-465

  10. Patterson Functions and Diffuse Scattering

    • Brent Fultz, James M. Howe
    Pages 467-522

  11. High-Resolution TEM Imaging

    • Brent Fultz, James M. Howe
    Pages 523-593

  12. Dynamical Theory

    • Brent Fultz, James M. Howe
    Pages 595-660

  13. Back Matter

    Pages 661-748
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Keywords

About this book

Aims and Scope of the Book This textbook was written for advanced un­ dergraduate students and beginning graduate students with backgrounds in physical science. Its goal is to acquaint them, as quickly as possible, with the central concepts and some details of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The topics in this book are developed to a level appropriate for most modern materials characterization research using TEM and XRD. There are, of course, many specialties that have attained a higher level of sophistication than presented here. The content of this book has been chosen in part to provide the background needed for a transition to these research specialties, or to other techniques such as neutron diffractometry. Although the book includes many practical details and examples, it does not cover some topics important for laboratory work. Perhaps the most obvious is the omission of specimen preparation methods for TEM. Beneath the details of principle and practice lies a larger goal of unifying the concepts common to both TEM and XRD. Coherence and wave interfer­ ence are conceptually similar for both x-ray waves and electron wavefunctions.

Authors and Affiliations

  • Division of Engineering and Applied Science, California Institute of Technology, Pasadena, USA

    Brent Fultz

  • Department of Materials Science and Engineering, University of Virginia, Charlottesville, USA

    James M. Howe

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