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Table of contents(130 papers)
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Fundamentals
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Quantification
About this book
Editors and Affiliations
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Phsysikalisches Inst., Universität Münster, Münster, Fed. Rep. of Germany
A. Benninghoven
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College of General Education, Osaka University, Osaka 560, Japan
J. Okano
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Department of Applied Physics, Osaka University, Osaka 565, Japan
R. Shimizu
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Philips Research Laboratories, Eindhoven, The Netherlands
H. W. Werner
Bibliographic Information
Book Title: Secondary Ion Mass Spectrometry SIMS IV
Book Subtitle: Proceedings of the Fourth International Conference, Osaka, Japan, November 13–19, 1983
Editors: A. Benninghoven, J. Okano, R. Shimizu, H. W. Werner
Series Title: Springer Series in Chemical Physics
DOI: https://doi.org/10.1007/978-3-642-82256-8
Publisher: Springer Berlin, Heidelberg
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eBook Packages: Springer Book Archive
Copyright Information: Springer-Verlag Berlin Heidelberg 1984
Softcover ISBN: 978-3-642-82258-2Published: 10 January 2012
eBook ISBN: 978-3-642-82256-8Published: 06 December 2012
Series ISSN: 0172-6218
Series E-ISSN: 2364-9003
Edition Number: 1
Number of Pages: XVI, 506
Topics: Mass Spectrometry, Physical Chemistry, Solid State Physics, Spectroscopy and Microscopy
Industry Sectors: Biotechnology, Chemical Manufacturing