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X-Ray Microscopy and Spectromicroscopy

Status Report from the Fifth International Conference, Würzburg, August 19–23, 1996

  • Jürgen Thieme
  • Günter Schmahl
  • Dietbert Rudolph
  • Eberhard Umbach

Table of contents

  1. Front Matter
    Pages I-XIX
  2. X-Ray Microscopy Projects

    1. Front Matter
      Pages 1-1
    2. W. Meyer-Ilse, H. Medecki, J. T. Brown, J. M. Heck, E. H. Anderson, A. Stead et al.
      Pages 3-12
    3. Joanna Abraham, Robin Medenwaldt, Erik Uggerhøj, P. Guttmann, T. Hjort, J. Jensenius et al.
      Pages 13-23
    4. Jörg Maser, Chris Jacobsen, Janos Kirz, Angelika Osanna, Steve Spector, Steve Wang et al.
      Pages 35-44
    5. Jean Susini, Ray Barrett
      Pages 45-54
    6. P. Guttmann, G. Schmahl, B. Niemann, D. Rudolph, G. Schneider, J. Bahrdt
      Pages 55-64
    7. Norio Watanabe, Atsuhiko Hirai, Kuniko Takemoto, Yoshio Shimanuki, Mieko Taniguchi, Eric Anderson et al.
      Pages 65-69
    8. Ulrich Bonse, Felix Beckmann, Frank Busch, Olaf Günnewig
      Pages 77-83
    9. G. R. Morrison, B. Niemann
      Pages 85-94
    10. R. E. Burge, X.-C. Yuan, J. N. Knauer
      Pages 95-103
  3. X-Ray Microscopy Applications

    1. Front Matter
      Pages 105-105
    2. Jürgen Niemeyer, Jürgen Thieme, Galina Machulla
      Pages 107-114
    3. J. Thieme, J. Niemeyer, G. Machulla, U. Schulte-Ebbert
      Pages 115-123
    4. Galina Machulla, Jürgen Thieme, Jürgen Niemeyer
      Pages 125-131
    5. R. Balhorn, R. E. Braun, B. Breed, J. T. Brown, D. Evenson, J. M. Heck et al.
      Pages 133-150
    6. C. J. Buckley, N. Khaleque, S. J. Bellamy, M. Robins, X. Zhang
      Pages 151-159
    7. B. Klösgen, P. Guttmann
      Pages 161-172
    8. P. Fischer, T. Eimüller, G. Schütz, G. Schmahl, P. Guttmann, D. Raasch
      Pages 173-178
    9. S. Lindaas, B. Calef, K. Downing, M. Howells, C. Magowan, D. Pinkas et al.
      Pages 179-190
    10. A. G. Michette, C. J. Buckley, S. J. Pfauntsch, N. Khaleque, T. English, M. Folkard et al.
      Pages 191-195
    11. Chris Jacobsen, Robin Medenwaldt, Shawn Williams
      Pages 197-206
  4. Microspectroscopy and Spectromicroscopy

    1. Front Matter
      Pages 217-217
    2. M. R. Weiss, V. Wüstenhagen, C. Heske, R. Fink, E. Umbach
      Pages 231-240
    3. G. Lilienkamp, C. Koziol, T. Schmidt, E. Bauer
      Pages 241-250
    4. J. Voss, K. Berens von Rautenfeld, M. Fornefett, J. Friedrich, M. Pretorius, M. Schroeder et al.
      Pages 251-260
    5. W. Engel, R. Degenhardt, A. M. Bradshaw, W. Erlebach, K. Ihmann, H. Kuhlenbeck et al.
      Pages 271-282
  5. X-Ray Optics

    1. Front Matter
      Pages 293-293
    2. S. J. Spector, C. J. Jacobsen, D. M. Tennant
      Pages 305-311
    3. M. Hettwer, D. Rudolph
      Pages 313-318
    4. V. V. Aristov
      Pages 319-325
    5. I. Snigireva, A. Souvorov, A. Snigirev
      Pages 327-336
  6. X-Ray Sources

    1. Front Matter
      Pages 349-349
    2. H. M. Hertz, L. Rymell, M. Berglund, L. Malmqvist
      Pages 351-361
    3. A. Ya. Faenov, T. A. Pikuz, A. A. Firsov, L. A. Panchenko, Yu. I. Koval, M. Fraenkel et al.
      Pages 363-372

About this book

Introduction

This book contains state-of-the-art reviews and up-to-date progress reports in the field of X-ray microscopy and spectromicroscopy, including related new X-ray optics and X-ray sources. It reflects the lively activities in a relatively new field of science which combines the development of new instruments and methods with their applications to numerous topical scientific questions. The applications range from biological and medical topics, colloid physics, and soil sciences to solid-state physics, material sciences, and surface sciences. The book appeals to researchers who are active in microscopic and spectromicroscopic studies.

Keywords

X-ray electromagnetic microscopy optics spectroscopy

Editors and affiliations

  • Jürgen Thieme
    • 1
  • Günter Schmahl
    • 1
  • Dietbert Rudolph
    • 1
  • Eberhard Umbach
    • 2
  1. 1.Forschungseinrichtung RöntgenphysikGeorg-August-Universität GöttingenGöttingenGermany
  2. 2.Experimentelle Physik IIUniversität WürzburgWürzburgGermany

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-642-72106-9
  • Copyright Information Springer-Verlag Berlin Heidelberg 1998
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-642-72108-3
  • Online ISBN 978-3-642-72106-9
  • Buy this book on publisher's site