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Advances in Scanning Probe Microscopy

  • Toshio Sakurai
  • Yousuke Watanabe

Part of the Advances in Materials Research book series (ADVSMATERIALS, volume 2)

About this book

Introduction

This book covers several of the most important topics of current interest in the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices.

Keywords

AFM Adsorption Experiment Fulleren Fullerene REM STM

Editors and affiliations

  • Toshio Sakurai
    • 1
  • Yousuke Watanabe
    • 1
  1. 1.Institute of Materials ResearchTohoku UniversityAoba-ku, SendaiJapan

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-642-56949-4
  • Copyright Information Springer-Verlag Berlin Heidelberg 2000
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-642-63084-2
  • Online ISBN 978-3-642-56949-4
  • Series Print ISSN 1435-1889
  • Buy this book on publisher's site
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