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© 2003

Point Defects in Semiconductors and Insulators

Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions

Book

Part of the Springer Series in Materials Science book series (SSMATERIALS, volume 51)

Table of contents

  1. Front Matter
    Pages I-XI
  2. Johann-Martin Spaeth, Harald Overhof
    Pages 1-10
  3. Johann-Martin Spaeth, Harald Overhof
    Pages 11-33
  4. Johann-Martin Spaeth, Harald Overhof
    Pages 35-73
  5. Johann-Martin Spaeth, Harald Overhof
    Pages 75-162
  6. Johann-Martin Spaeth, Harald Overhof
    Pages 163-195
  7. Johann-Martin Spaeth, Harald Overhof
    Pages 197-264
  8. Johann-Martin Spaeth, Harald Overhof
    Pages 265-308
  9. Johann-Martin Spaeth, Harald Overhof
    Pages 309-413
  10. Johann-Martin Spaeth, Harald Overhof
    Pages 415-442
  11. Back Matter
    Pages 443-492

About this book

Introduction

This book introduces the principles and techniques of modern electron paramagnetic resonance (EPR) spectroscopy that are essential for applications used to determine  microscopic defect structures. Many different magnetic resonance methods are required for investigating the microscopic and electronic properties of solids and uncovering correlations between those properties. In addition to EPR such methods include electron nuclear double resonance (ENDOR), electronically and optically detected EPR (the latter is known as ODENDOR), and electronically and optically detected ENDOR. This book comprehensively discusses experimental, technological, and theoretical aspects of these techniques from a practical point of view with many illustrative examples taken from semiconductors and insulators. The non-specialist is informed about the potential of the different methods. A researcher finds practical help in the application of commercial apparatus as well as useful guidance from ab initio theory for the task of deriving structure models from experimental data.

Keywords

Density Functional Theory (DFT) Electrical Detection of EPR and ENDOR (EDEPR/EDENDOR) Electron Nuclear Double Resonance (ENDOR) Electron Paramagnetic Resonance (EPR) Exciton Optically Detected EPR and ENDOR (ODEPR/ODENDOR) Semiconductor

Authors and affiliations

  1. 1.Fachbereich PhysikUniversität PaderbornPaderbornGermany

Bibliographic information

  • Book Title Point Defects in Semiconductors and Insulators
  • Book Subtitle Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions
  • Authors Johann-Martin Spaeth
    Harald Overhof
  • Series Title Springer Series in Materials Science
  • DOI https://doi.org/10.1007/978-3-642-55615-9
  • Copyright Information Springer-Verlag Berlin Heidelberg 2003
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Hardcover ISBN 978-3-540-42695-0
  • Softcover ISBN 978-3-642-62722-4
  • eBook ISBN 978-3-642-55615-9
  • Series ISSN 0933-033X
  • Series E-ISSN 2196-2812
  • Edition Number 1
  • Number of Pages XI, 492
  • Number of Illustrations 0 b/w illustrations, 0 illustrations in colour
  • Topics Electronics and Microelectronics, Instrumentation
    Optical and Electronic Materials
  • Buy this book on publisher's site
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