© 1983

EXAFS and Near Edge Structure

Proceedings of the International Conference Frascati, Italy, September 13–17, 1982

  • Antonio Bianconi
  • Lucia Incoccia
  • Stanislao Stipcich
Conference proceedings

Part of the Springer Series in Chemical Physics book series (CHEMICAL, volume 27)

Table of contents

  1. EXAFS Data Analysis

    1. N. Motta, M. De Crescenzi, A. Balzarotti
      Pages 103-106
    2. R. Frahm, R. Haensel, P. Rabe
      Pages 107-109
    3. E. Pantos, D. Firth
      Pages 110-111
    4. Yu. A. Babanov, A. L. Ageev, V. V. Vasin, N. V. Ershov
      Pages 112-113
  2. XANES

    1. Front Matter
      Pages 117-117
    2. J. Wong, R. P. Messmer, D. H. Maylotte, F. W. Lytle
      Pages 130-134
    3. S. M. Heald, H. A. Goldberg, I. L. Kalnin
      Pages 141-143
    4. D. Norman, P. J. Durham, J. B. Pendry, J. Stöhr, R. Jaeger
      Pages 147-150
    5. B. Lengeler, J. E. Müller, G. Materlik
      Pages 151-153
    6. R. Ingalls, J. M. Tranquada, J. E. Whitmore, E. D. Crozier
      Pages 154-156
    7. P. H. Gaskell, D. M. Glover, A. K. Livesey, P. J. Durham, G. N. Greaves
      Pages 157-161
    8. I. Davoli, S. Stizza, M. Benfatto, O. Gzowski, L. Murawski, A. Bianconi
      Pages 162-164
    9. T. K. Sham, B. S. Brunschwig
      Pages 168-170
    10. S. G. Saxena, H. S. Chauhan, Satish Chandra, K. B. Garg
      Pages 171-173
    11. R. Camilloni, E. Fainelli, G. Petrocelli, G. Stefani
      Pages 174-176

About these proceedings


The field of X-ray spectroscopy using synchrotron radiation is growing so rapidly and expanding into such different research areas that it is now diffi­ cult to keep up with the literature. EXAFS and XANES are becoming interdis­ ciplinary methods used in solid-state physics, biology, and chemistry, and are making impressive contributions to these branches of science. The present book gives a panorama of the research activity in this field. It contains the papers presented at the International Conference on EXAFS and Near Edge Structure held in Frascati, Italy, September 13-17, 1982. This was the first international conference devoted to EXAFS spectroscopy (Extended X-ray Ab­ sorption Fine Structure) and its applications. The other topic of the con­ ference was the new XANES (X-ray Absorption Near Edge Structure), which in of experimental and theoretical developments finally appears to have terms left its infancy. The applications of EXAFS concern the determination of local structures in complex systems; we have therefore divided the subject matter into differ­ ent parts on various types of materials: amorphous metals, glasses, solu­ tions, biological systems, catalysts, and special crystals such as mixed valence systems and ionic conductors. EXAFS provides unique information for each kind of system, but the analysis of EXAFS data also poses special prob­ lems in each case. General problems of EXAFS data analysis are discussed, as well as developments in instrumentation for X-ray absorption using syn­ chrotron radiation and laboratory EXAFS.


chemistry crystal solid-state physics

Editors and affiliations

  • Antonio Bianconi
    • 1
  • Lucia Incoccia
    • 2
  • Stanislao Stipcich
    • 3
  1. 1.Dipartimento di FisicaUniversità di RomaRomaItaly
  2. 2.Laboratori Nazionali di FrascatiPULS-CNRFrascatiItaly
  3. 3.Laboratori Nazionali di FrascatiINFNFrascatiItaly

Bibliographic information

  • Book Title EXAFS and Near Edge Structure
  • Book Subtitle Proceedings of the International Conference Frascati, Italy, September 13–17, 1982
  • Editors A. Bianconi
    L. Inoccia
    S. Stipcich
  • Series Title Springer Series in Chemical Physics
  • DOI
  • Copyright Information Springer-Verlag Berlin Heidelberg 1983
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Hardcover ISBN 978-3-540-12411-5
  • Softcover ISBN 978-3-642-50100-5
  • eBook ISBN 978-3-642-50098-5
  • Series ISSN 0172-6218
  • Edition Number 1
  • Number of Pages XII, 422
  • Number of Illustrations 193 b/w illustrations, 0 illustrations in colour
  • Topics Crystallography and Scattering Methods
  • Buy this book on publisher's site