© 2014

In-situ Materials Characterization

Across Spatial and Temporal Scales

  • Alexander Ziegler
  • Heinz Graafsma
  • Xiao Feng Zhang
  • Joost W.M. Frenken


  • Scientific status report on analytical techniques in nano-and surface sciences

  • Presentation of the basics and applications of various surface and thin film analytical -techniques: Scanning Probe Microscopy, X-ray diffraction at synchrotron, Free-Electron-Laser sources, Ultra-fast TEM and Electron Diffraction, FIB/SEM, X-ray photoelectron spectroscopy

  • Presentation of advanced techniques for bulk analysis: X-ray absorption spectroscopy, Time-Resolved Neutron Scattering


Part of the Springer Series in Materials Science book series (SSMATERIALS, volume 193)

Table of contents

  1. Front Matter
    Pages i-xi
  2. Xiao Feng Zhang
    Pages 59-109
  3. Götz Eckold, Helmut Schober
    Pages 147-179
  4. Joost W. M. Frenken
    Pages 181-206
  5. Alexander Ziegler, Heinz Graafsma
    Pages 207-250
  6. Back Matter
    Pages 251-256

About this book


The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly, or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes, and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical, and x-ray microscopies (e.g., scanning, transmission, and low-energy electron microscopy, and scanning probe microscopy), or in the scattering realm with x-ray, neutron and electron diffraction.


In-situ characterization Material dynamics Nanoanalysis Nanoscale materials Neutron scattering Photoelectron spectroscopy Scanning probe techniques Structure-property Ultra-fast analysis X-ray absorption spectroscopy

Editors and affiliations

  • Alexander Ziegler
    • 1
  • Heinz Graafsma
    • 2
  • Xiao Feng Zhang
    • 3
  • Joost W.M. Frenken
    • 4
  1. 1.Microscopy & Microanalysis UnitThe University of the WitwatersrandJohannesburgGermany
  2. 2.Photon-Science Detector GroupDeutsches Elektronen SynchrotronHamburgGermany
  3. 3.Nanotechnology Systems DivisionHitachi High Technologies America, Inc.PleasantonUSA
  4. 4.Leiden University Kamerlingh Onnes LaboratoryLeidenThe Netherlands

Bibliographic information

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