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© 2013

VLSI Design and Test

17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers

  • Manoj Singh Gaur
  • Mark Zwolinski
  • Vijay Laxmi
  • Dharmendra Boolchandani
  • Virendra Sing
  • Adit D. Sing
  • 17th International Symposium on VLSI Design and Test, VDAT 2013

Conference proceedings

Part of the Communications in Computer and Information Science book series (CCIS, volume 382)

Table of contents

  1. Front Matter
  2. Bhupendra Singh Reniwal, Santosh Kumar Vishvakarma
    Pages 1-9
  3. Gudlavalleti Rajahari, Yashu Anand Varshney, Subash Chandra Bose
    Pages 10-18
  4. R. K. Naga Mahesh, Akash Ganesan, Manchi Pavan Kumar, Roy Paily
    Pages 26-34
  5. Shrirang Korde, Amol Khandare, Raghavendra Deshmukh, Rajendra Patrikar
    Pages 35-43
  6. Akhtar W. Alam, Esakkimuthu Dhakshinamoorthy, Prince Mathew, Narender Ponna
    Pages 44-48
  7. Rahul Krishnamurthy, G. K. Sharma
    Pages 49-58
  8. Akhil Rathore, Chetan D Parikh
    Pages 59-65
  9. Sameer Pawanekar, Kalpesh Kapoor, Gaurav Trivedi
    Pages 66-73
  10. Kanchan Manna, Shailesh Singh, Santanu Chattopadhyay, Indranil Sengupta
    Pages 74-82
  11. Amit Sharma, Ravindra Mukhiya, S. Santosh Kumar, B. D. Pant
    Pages 94-99
  12. Sachin Maheshwari, Himadri Singh Raghav, Anu Gupta
    Pages 108-117
  13. Somnath Paul, Abhijit Dana, Soumya Pandit
    Pages 128-137
  14. Sachin Agrawal, Sunil Pandey, Jawar Singh, P. N. Kondekar
    Pages 138-145
  15. Surabhi Singh, Brajesh K. Kaushik, Sudeb Dasgupta
    Pages 146-152

About these proceedings

Introduction

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

Keywords

SRAM arrays VLSI digital circuits multi-processor architectures network-on-chip

Editors and affiliations

  • Manoj Singh Gaur
    • 1
  • Mark Zwolinski
    • 2
  • Vijay Laxmi
    • 1
  • Dharmendra Boolchandani
    • 1
  • Virendra Sing
    • 3
  • Adit D. Sing
    • 4
  1. 1.MNITJaipurIndia
  2. 2.University of SouthamptonUK
  3. 3.IIT BombayMumbaiIndia
  4. 4.Auburn UniversityUSA

Bibliographic information

  • Book Title VLSI Design and Test
  • Book Subtitle 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers
  • Editors Manoj Singh Gaur
    Mark Zwolinski
    Vijay Laxmi
    D. Boolchandani
    Virendra Sing
    Adit Singh
  • Series Title Communications in Computer and Information Science
  • DOI https://doi.org/10.1007/978-3-642-42024-5
  • Copyright Information Springer-Verlag Berlin Heidelberg 2013
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Computer Science Computer Science (R0)
  • Softcover ISBN 978-3-642-42023-8
  • eBook ISBN 978-3-642-42024-5
  • Series ISSN 1865-0929
  • Series E-ISSN 1865-0937
  • Edition Number 1
  • Number of Pages XVI, 388
  • Number of Illustrations 246 b/w illustrations, 0 illustrations in colour
  • Topics Computer Hardware
    Processor Architectures
    Computer Communication Networks
  • Buy this book on publisher's site
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