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© 2014

Frontiers in Optical Methods

Nano-Characterization and Coherent Control

  • Ken-ichi Shudo
  • Ikufumui Katayama
  • Shin-Ya Ohno

Benefits

  • Gives a survey of advanced methods in current optical measurements

  • Reviews the most up-to-date topics in an introductory way

  • Numerous references to the original works help students and newcomers to enter the field

Book

Part of the Springer Series in Optical Sciences book series (SSOS, volume 180)

Table of contents

  1. Front Matter
    Pages i-xii
  2. Reflectance Spectroscopy

  3. Ultrafast and Coherent Measurement

    1. Front Matter
      Pages 83-83
    2. Keiko Kato, Katsuya Oguri, Masahiro Kitajima
      Pages 105-127
    3. Masayoshi Tonouchi
      Pages 153-166
    4. Ikufumui Katayama, Masaaki Ashida
      Pages 167-184
  4. THz-Technology

  5. Back Matter
    Pages 225-228

About this book

Introduction

This collection of reviews by leading Japanese researchers covers topics like ultrafast optical responses, terahertz and phonon studies, super-sensitive surface and high-pressure spectroscopy, combination of visible and x-ray photonics. Several related areas at the cutting edge of measurement technology and materials science are included. This book is partly based on well-cited review articles in the Japanese language in special volumes of the Journal of the Vacuum Society of Japan.

Keywords

Laser laser THz spectroscopy X-ray technicques extreme methods in optical measurements microstructures phonon techniques surface differential reflectance spectroscopy synchrotron radiation ultrafast spectroscopy wave propagation in thin films and

Editors and affiliations

  • Ken-ichi Shudo
    • 1
  • Ikufumui Katayama
    • 2
  • Shin-Ya Ohno
    • 3
  1. 1.Yokohama National UniversityYokohama National UniversityYokohamaJapan
  2. 2.Faculty of EngeneeringYokohama National UniversityYokohamaJapan
  3. 3.Faculty of EngeneeringYokohama National UniversityYokohamaJapan

Bibliographic information

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