Semiconductor Research

Experimental Techniques

  • Amalia Patane
  • Naci Balkan

Part of the Springer Series in Materials Science book series (SSMATERIALS, volume 150)

Table of contents

  1. Front Matter
    Pages i-xix
  2. David L. Sales, Ana M. Beltrán, Juan G. Lozano, José M. Mánuel, M. Paz Guerrero-Lebrero, Teresa Ben et al.
    Pages 23-62
  3. Robert Kudrawiec, Jan Misiewicz
    Pages 95-124
  4. Andrew Prins, Alf Adams, Stephen Sweeney
    Pages 171-195
  5. Gintautas Tamulaitis
    Pages 197-221
  6. Andrea Balocchi, Thierry Amand, Xavier Marie
    Pages 223-258
  7. Jordi Ibáñez, Ramon Cuscó
    Pages 259-281
  8. Oleksiy Drachenko, Manfred Helm
    Pages 283-307
  9. Ayşe Erol, M. Çetin Arıkan
    Pages 333-365
  10. Back Matter
    Pages 367-372

About this book

Introduction

The book describes the fundamentals, latest developments and use of key experimental techniques for semiconductor research. It explains the application potential of various analytical methods and discusses the opportunities to apply particular analytical techniques to study novel semiconductor compounds, such as dilute nitride alloys. The emphasis is on the technique rather than on the particular system studied.

Keywords

Raman spectroscopy catodoluminescence cyclotron resonance hot carrier transport optical modulation spectroscopy photoluminescence scaning near field optical microscopy time resolved optical spectroscopy transmision electron microscopy transport in high magnetic fields

Editors and affiliations

  • Amalia Patane
    • 1
  • Naci Balkan
    • 2
  1. 1., School of Physics and AstronomyThe University of NottinghamNottinghamMontserrat
  2. 2., School of Computer Science andUniversity of EssexEssexMontserrat

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-642-23351-7
  • Copyright Information Springer-Verlag Berlin Heidelberg 2012
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Physics and Astronomy
  • Print ISBN 978-3-642-23350-0
  • Online ISBN 978-3-642-23351-7
  • Series Print ISSN 0933-033X
  • Series Online ISSN 2196-2812
  • About this book
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