Kelvin Probe Force Microscopy

Measuring and Compensating Electrostatic Forces

  • Sascha Sadewasser
  • Thilo Glatzel

Part of the Springer Series in Surface Sciences book series (SSSUR, volume 48)

Table of contents

  1. Front Matter
    Pages i-xiv
  2. S. Sadewasser, Th. Glatzel
    Pages 1-3
  3. Technical Aspects

    1. Front Matter
      Pages 1-1
    2. S. Sadewasser
      Pages 7-24
    3. H. Diesinger, D. Deresmes, T. Mélin
      Pages 25-44
    4. Y. Rosenwaks, G. Elias, E. Strassbourg, A. Schwarzman, A. Boag
      Pages 45-67
    5. Laurent Nony, Franck Bocquet, Adam S. Foster, Christian Loppacher
      Pages 69-97
  4. Selected Applications

    1. Front Matter
      Pages 99-99
    2. S. Sadewasser
      Pages 151-174
    3. Yoichi Miyahara, Lynda Cockins, Peter Grütter
      Pages 175-199
    4. H. Onishi, A. Sasahara
      Pages 201-219
    5. Christian Loppacher
      Pages 221-241
    6. B. J. Rodriguez, S. V. Kalinin
      Pages 243-287
  5. Back Matter
    Pages 329-331

About this book


In the nearly 20 years of Kelvin probe force microscopy an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.


Kelvin probe microscopy Nanotechnology Scanning probe microscopy Surface potential Surface science

Editors and affiliations

  • Sascha Sadewasser
    • 1
  • Thilo Glatzel
    • 2
  1. 1.LaboratoryInternational Iberian NanotechnologyBragaPortugal
  2. 2.Inst. PhysikUniversität BaselBaselSwitzerland

Bibliographic information

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