Testing – Practice and Research Techniques

5th International Academic and Industrial Conference, TAIC PART 2010, Windsor, UK, September 3-5, 2010. Proceedings

  • Leonardo Bottaci
  • Gordon Fraser
Conference proceedings TAIC PART 2010

Part of the Lecture Notes in Computer Science book series (LNCS, volume 6303)

Table of contents

  1. Front Matter
  2. Keynote Addresses

  3. Full Papers

    1. P. Vijay Suman, Tukaram Muske, Prasad Bokil, Ulka Shrotri, R. Venkatesh
      Pages 8-22
    2. Qiang Guo, John Derrick, Clara Benac Earle, Lars-Åke Fredlund
      Pages 23-38
    3. Daniel Hoffman, Chien Chang, Gary Bazdell, Brett Stevens, Kevin Yoo
      Pages 39-55
    4. Frank Eichinger, Victor Pankratius, Philipp W. L. Große, Klemens Böhm
      Pages 56-71
    5. Antti Jääskeläinen
      Pages 72-87
    6. Ben W. Y. Kam, Thomas R. Dean
      Pages 104-117
  4. Tool Papers

    1. Christian Wiederseiner, Shahnewaz A. Jolly, Vahid Garousi, Matt M. Eskandar
      Pages 118-128
    2. Negar Koochakzadeh, Vahid Garousi
      Pages 129-136
    3. Fayçal Bessayah, Ana Cavalli, Willian Maja, Eliane Martins, Andre Willik Valenti
      Pages 137-146
    4. Marko Kääramees, Jüri Vain, Kullo Raiend
      Pages 147-154
    5. Siamak Haschemi, Stephan Weißleder
      Pages 155-164
  5. Challenge Paper

  6. Experience Reports

    1. Yana Momchilova Mileva, Valentin Dallmeier, Andreas Zeller
      Pages 173-180
    2. Muzammil Shahbaz, Robert Eschbach
      Pages 181-188
  7. Fast Abstracts

    1. Mohammad Saeed Abou Trab, Bachar Alrouh, Steve Counsell, Rob M. Hierons, George Ghinea
      Pages 194-197
    2. Konstantinos Bratanis, Dimitris Dranidis, Anthony J. H. Simons
      Pages 203-206
    3. Lydie du Bousquet
      Pages 207-210
    4. Phillip Heidegger, Annette Bieniusa, Peter Thiemann
      Pages 211-214
    5. André Riboira, Rui Abreu
      Pages 215-218
  8. Back Matter

About these proceedings


A Message from the TAIC PART 2010 General Chair TAIC PART is a unique event that strives to combine aspects of a conference, a workshop and a retreat. Its purpose is to bring together industrialists and academics in an environment that promotes fundamental collaborationon pr- lems in software testing. Among the wide range of topics in computer science andsoftwareengineering,softwaretesting is anidealcandidatefor academicand industrialcollaborationbecauseadvancesinresearchcanhavesuchwide-ranging and far-reaching implications for industry. Conversely, the advances in comp- ing and communications technology and the growth of the associated software engineering activity are producing new researchchallengesat an increasing rate. The problems that arise in software testing are related to the problems that ariseinmanyotherareasofcomputing.Assuch,testingresearchcombinesawide range of elements encompassing the theoretical work of program analysis and formal methods and the associated representations such as ?nite-state machines and dependence graphs. The inherent complexity of software testing has led to the involvement of heuristic methods. Software testing is also a human activity and has thus seen the involvement of psychology,sociologyand even philosophy. This astonishing breadth and depth have made the problems of software testing appealing to academics for several decades.


Debugging Eiffel Erlang Factor Open-Source Refactoring automated debugging documentation dynamic software analysis model checking performance evaluation regression testing software analysis software reliability testing

Editors and affiliations

  • Leonardo Bottaci
    • 1
  • Gordon Fraser
    • 2
  1. 1.Department of Computer ScienceUniversity of HullHullUK
  2. 2.Department of Computer ScienceSaarland UniversitySaarbrückenGermany

Bibliographic information

  • DOI
  • Copyright Information Springer-Verlag Berlin Heidelberg 2010
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Computer Science Computer Science (R0)
  • Print ISBN 978-3-642-15584-0
  • Online ISBN 978-3-642-15585-7
  • Series Print ISSN 0302-9743
  • Series Online ISSN 1611-3349
  • Buy this book on publisher's site
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