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Scanning Probe Microscopy in Nanoscience and Nanotechnology

  • Bharat  Bhushan

Part of the NanoScience and Technology book series (NANO)

Table of contents

  1. Front Matter
    Pages i-xxx
  2. Scanning Probe Microscopy Techniques

    1. Front Matter
      Pages 1-1
    2. Hendrik Hölscher, Daniel Ebeling, Jan-Erik Schmutz, Marcus M. Schäefer, Boris Anczykowski
      Pages 3-21
    3. Pietro Giuseppe Gucciardi, Marc Lamy de La Chapelle, Jean-Christophe Valmalette, Gennaro Picardi, Razvigor Ossikovski
      Pages 57-88
    4. Edward D. de Asis Jr., You Li, Alex J. Austin, Joseph Leung, Cattien V. Nguyen
      Pages 129-168
  3. Characterization

    1. Front Matter
      Pages 325-325
    2. A. Ebner, L. A. Chtcheglova, J. Preiner, J. Tang, L. Wildling, H. J. Gruber et al.
      Pages 325-362
    3. Noël M. Ziebarth, Felix Rico, Vincent T. Moy
      Pages 363-393
    4. F. Consolo, F. Mastrangelo, G. Ciardelli, F. M. Montevecchi, U. Morbiducci, M. Sassi et al.
      Pages 425-486
    5. Nicola M. Pugno
      Pages 487-506
    6. Armen N. Kocharian, Gayanath W. Fernando, Chi Yang
      Pages 507-570
    7. Gheorghe Stan, Robert F. Cook
      Pages 571-611
    8. Mario D’Acunto
      Pages 647-686
  4. Industrial Applications

    1. Front Matter
      Pages 723-723
    2. Kunio Takeyasu, Hugo Maruyama, Yuki Suzuki, Kohji Hizume, Shige H. Yoshimura
      Pages 723-756
    3. Eugenio Cefalì, Salvatore Patanè, Maria Allegrini
      Pages 757-793
    4. Debin Wang, Robert Szoszkiewicz, Vamsi Kodali, Jennifer Curtis, Seth Marder, Elisa Riedo
      Pages 795-811
    5. Luohan Peng, Hyungoo Lee, Hong Liang
      Pages 813-832
    6. Cvetelin Vasilev, Günter Reiter, Khalil Jradi, Sophie Bistac, Marjorie Schmitt
      Pages 833-866
    7. Michael A. Giordano, Steven R. Schmid
      Pages 867-914
    8. Fabio Lima Leite, Alexandra Manzoli, Paulo Sérgio Paula de Herrmann Jr, Osvaldo Novais Oliveira Jr, Luiz Henrique Capparelli Mattoso
      Pages 915-944
  5. Back Matter
    Pages 945-956

About this book

Introduction

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and  typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber

Keywords

Industrie Nanomaterial Sensor atomic force microscope biomimetics biosensor carbon nanotubes electronics mechanics modeling nanoscience nanostructure nanotechnology soft matter surface

Editors and affiliations

  • Bharat  Bhushan
    • 1
  1. 1.Nanoprobe Lab. Bio- & Nanotechnology &Ohio State UniversityColumbusU.S.A.

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-642-03535-7
  • Copyright Information Springer-Verlag Berlin Heidelberg 2010
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Chemistry and Materials Science
  • Print ISBN 978-3-642-03534-0
  • Online ISBN 978-3-642-03535-7
  • Series Print ISSN 1434-4904
  • Buy this book on publisher's site
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