© 2008

Applied Scanning Probe Methods X

Biomimetics and Industrial Applications

  • Bharat Bhushan
  • Masahiko Tomitori
  • Harald Fuchs
  • First book summarizing the state-of-the-art of this technique

  • Real industrial applications included


Part of the Nano Science and Technolgy book series (NANO)

Table of contents

  1. Front Matter
    Pages I-LIX
  2. Filippo Giannazzo, Patrick Fiorenza, Vito Raineri
    Pages 63-103
  3. Joachim Loos, Alexander Alexeev
    Pages 183-215
  4. Hiroyuki Sugimura
    Pages 217-255
  5. Mario D’Acunto, Paolo Giusti, Franco Maria Montevecchi, Gianluca Ciardelli
    Pages 257-283
  6. Tatsuo Ushiki, Kazushige Kawabata
    Pages 285-308
  7. Back Matter
    Pages 413-427

About this book


The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale. Vol. IX focuses on characterization of material surfaces including structural as well as local mechanical characterization, and molecular systems. The volume covers a broad spectrum of STM/AFM investigations including fullerene layers, force spectroscopy for probing material properties in general, biological lms .and cells, epithelial and endothelial layers, medical related systems such as amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical properties ofpolymernanostructures, technical polymers, and near eld optics.


AFM STEM Tissue Engineering ceramics microscopy modeling polymer

Editors and affiliations

  • Bharat Bhushan
    • 1
  • Masahiko Tomitori
    • 2
  • Harald Fuchs
    • 3
  1. 1.Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM)The Ohio State UniversityColumbusUSA
  2. 2.Advanced Institute of Science & TechnologySchool of Materials ScienceIshikawaJapan
  3. 3.Institute of Physics, FB 16University of MünsterMünsterGermany

Bibliographic information

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