© 2008

Applied Scanning Probe Methods IX


  • Masahiko Tomitori
  • Bharat Bhushan
  • Harald Fuchs


  • First book summarizing the state-of-the-art of this technique

  • Real industrial applications included


Part of the Nano Science and Technolgy book series (NANO)

Table of contents

  1. Front Matter
    Pages I-LIX
  2. Luca Gavioli, Cinzia Cepek
    Pages 1-21
  3. Félix Rico, Ewa P. Wojocikiewicz, Vincent T. Moy
    Pages 89-109
  4. Claire Verbelen, Guillaume Andre, Xavier Haulot, Yann Gilbert, David Alsteens, Etienne Dague et al.
    Pages 111-126
  5. Christoph Riethmüller, Hans Oberleithner
    Pages 127-148
  6. Hyonchol Kim, Hironori Uehara, Rehana Afrin, Hideo Arakawa, Hiroshi Sekiguchi, Toshiya Osada et al.
    Pages 149-175
  7. Annalisa Relini, Ornella Cavalleri, Claudio Canale, Tiziana Svaldo-Lanero, Ranieri Rolandi, Alessandra Gliozzi
    Pages 177-205
  8. Zoya Leonenko, David T. Cramb, Matthias Amrein, Eric Finot
    Pages 207-234
  9. Back Matter
    Pages 373-387

About this book


The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale. Vol. IX focuses on characterization of material surfaces including structural as well as local mechanical characterization, and molecular systems. The volume covers a broad spectrum of STM/AFM investigations including fullerene layers, force spectroscopy for probing material properties in general, biological lms .and cells, epithelial and endothelial layers, medical related systems such as amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical properties ofpolymernanostructures, technical polymers, and near eld optics.


AFM Fulleren Fullerene REM STM ceramics microscopy nanotechnology polymer spectroscopy

Editors and affiliations

  • Masahiko Tomitori
    • 1
  • Bharat Bhushan
    • 2
  • Harald Fuchs
    • 3
  1. 1.Advanced Institute of Science & TechnologySchool of Materials ScienceIshikawaJapan
  2. 2.Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM)The Ohio State UniversityColumbusUSA
  3. 3.Institute of Physics, FB 16University of MünsterMünsterGermany

Bibliographic information

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