© 1995

Energy-Filtering Transmission Electron Microscopy

  • Ludwig Reimer

Part of the Springer Series in Optical Sciences book series (SSOS, volume 71)

Table of contents

  1. Front Matter
    Pages I-XIII
  2. Ludwig Reimer
    Pages 1-42
  3. Harald Rose, Dieter Krahl
    Pages 43-149
  4. Peter Schattschneider, Bernard Jouffrey
    Pages 151-224
  5. Ferdinand Hofer
    Pages 225-268
  6. Ray F. Egerton, Richard D. Leapman
    Pages 269-290
  7. Joachim Mayer, Christine Deininger, Ludwig Reimer
    Pages 291-345
  8. Ludwig Reimer
    Pages 347-400
  9. John C. H. Spence
    Pages 401-418
  10. Back Matter
    Pages 419-425

About this book


Energy-Filtering Transmission Electron Microscopy (EFTEM) presents a summary of the electron optics, the electron-specimen interactions, and the operation and contrast modes of this new field of analytical electron microscopy. The electron optics of filter lenses and the progress in the correction of aberrations are discussed in detail. An evaluation of our present knowledge of plasmon losses and inner-shell ionisations is of increasing interest for a quantitative application of EFTEM in materials and life sciences. This can be realized not only by filtering the elastically scattered electrons but mainly by imaging and analyzing with inelastically scattered electrons at different energy losses up to 2000 eV. The strength of EFTEM is the combination of the modes of electron energy-loss spectroscopy (EELS), Electron Spectroscopic Imaging (ESI) and Diffraction (ESD) and of energy filtering Reflection Electron Microscopy (REM) in one instrument.


electron diffraction electron energy-loss spectroscopy electron filter lenses electron microscopy electron optics microscopy spectroscopy transmission electron microscopy complexity

Editors and affiliations

  • Ludwig Reimer
    • 1
  1. 1.Physikalisches InstitutUniversität MünsterMünsterGermany

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"This book gives an excellent introduction to the topic...and can be advised both as a text book for researchers new in this field as well as those looking for a basic reference to the topic." - Physicalia