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© 1990

Photoacoustic and Photothermal Phenomena II

Proceedings of the 6th International Topical Meeting, Baltimore, Maryland, July 31–August 3, 1989

  • John C. Murphy
  • Jane W. Maclachlan Spicer
  • Leonard C. Aamodt
  • Barrie S. H. Royce
Conference proceedings

Part of the Springer Series in Optical Sciences book series (SSOS, volume 62)

Table of contents

  1. Front Matter
    Pages I-XXI
  2. Imaging and Characterization

    1. Front Matter
      Pages 1-1
    2. J. Pelzl, U. Netzelmann, Th. Orth, R. Kordecki
      Pages 2-12
    3. M. Beyfuss, J. Baumann, R. Tilgner
      Pages 17-20
    4. J. Rantala, J. Hartikainen, R. Lehtiniemi, R. Vuohelainen, M. Oksanen, J. Jaarinen et al.
      Pages 21-23
    5. Y. Q. Wang, P. K. Kuo, L. D. Favro, R. L. Thomas
      Pages 24-26
    6. T. Ahmed, H. J. Jin, P. Chen, P. K. Kuo, L. D. Favro, R. L. Thomas
      Pages 30-32
    7. X. M. Teng, L. J. Inglehart
      Pages 37-39
    8. L. J. Inglehart
      Pages 40-43
  3. Nondestructive Evaluation and Layered Systems

About these proceedings

Introduction

Photothermal science continues to be an area of rapid development and active investigation, as is demonstrated by this volume. The various contributions present fundamental research in materials science, physics, chemistry, biology, and medicine, as well as important applications of photothermal techniques in nondestructive evaluation, aeronomy and pollution control, and other areas. The topics treated include measurements of spectral properties of gases, the theory of thermally generated elastic waves, a method of monitoring local surface displacements, materials characterization and nondestructive evaluation of materials, studies of the dynamics of primary photophysical processes, fast energy exchange at surfaces and at interfaces (e.g. in medicine and photobiology), thermal EXAFS and XANES applied to metals and semiconductors, and imaging of magnetic materials using microwave sources.

Keywords

Characterization Photoacoustic Specttroscopy imaging photothermal semiconductor spectra

Editors and affiliations

  • John C. Murphy
    • 1
  • Jane W. Maclachlan Spicer
    • 2
  • Leonard C. Aamodt
    • 2
  • Barrie S. H. Royce
    • 3
  1. 1.Materials Science Department and Applied Physics LaboratoryThe Johns Hopkins UniversityLaurelUSA
  2. 2.Applied Physics LaboratoryThe Johns Hopkins UniversityLaurelUSA
  3. 3.School of Engineering and Applied Science, Department of Mechanical and Aerospace EngineeringPrinceton UniversityPrincetonUSA

Bibliographic information

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