Spectroscopic Ellipsometry for Photovoltaics

Volume 2: Applications and Optical Data of Solar Cell Materials

  • Hiroyuki Fujiwara
  • Robert W. Collins

Part of the Springer Series in Optical Sciences book series (SSOS, volume 214)

Table of contents

  1. Front Matter
    Pages i-xxi
  2. Hiroyuki Fujiwara
    Pages 1-26
  3. Application of Ellipsometry Technique

    1. Front Matter
      Pages 27-27
    2. Hiroyuki Fujiwara, Akihiro Nakane, Daisuke Murata, Hitoshi Tampo, Takuya Matsui, Hajime Shibata
      Pages 29-82
    3. Prakash Koirala, Abdel-Rahman A. Ibdah, Puruswottam Aryal, Puja Pradhan, Zhiquan Huang, Nikolas J. Podraza et al.
      Pages 83-138
    4. Hiroyuki Fujiwara, Yuichiro Sago
      Pages 139-168
    5. Ambalanath Shan, Jie Chen, Prakash Koirala, Kenneth R. Kormanyos, Nikolas J. Podraza, Robert W. Collins
      Pages 169-207
    6. Puja Pradhan, Abdel-Rahman A. Ibdah, Puruswottam Aryal, Dinesh Attygalle, Nikolas J. Podraza, Sylvain Marsillac et al.
      Pages 209-253
    7. Zhiquan Huang, Lila R. Dahal, Sylvain Marsillac, Nikolas J. Podraza, Robert W. Collins
      Pages 255-315
  4. Optical Data of Solar-Cell Component Materials

    1. Front Matter
      Pages 317-317
    2. Akihiro Nakane, Shohei Fujimoto, Gerald E. Jellison Jr., Craig M. Herzinger, James N. Hilfiker, Jian Li et al.
      Pages 319-426
    3. Takemasa Fujiseki, Shohei Fujimoto, Mariano Campoy-Quiles, Maria Isabel Alonso, Takurou N. Murakami, Tetsuhiko Miyadera et al.
      Pages 427-469
    4. Shohei Fujimoto, Takemasa Fujiseki, Masato Tamakoshi, Akihiro Nakane, Tetsuhiko Miyadera, Takeshi Sugita et al.
      Pages 471-493
    5. Akihiro Nakane, Shohei Fujimoto, Masato Tamakoshi, Takashi Koida, James N. Hilfiker, Gerald E. Jellison Jr. et al.
      Pages 495-541
    6. Shohei Fujimoto, Takemasa Fujiseki, Hiroyuki Fujiwara
      Pages 543-574
    7. Shohei Fujimoto, Takemasa Fujiseki, James N. Hilfiker, Nina Hong, Mariano Campoy-Quiles, Hiroyuki Fujiwara
      Pages 575-608
  5. Back Matter
    Pages 609-616

About this book


Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizations in solar cell research fields. In particular, device performance analyses using exact optical constants of component layers and direct analyses of complex solar cell structures are unique features of advanced ellipsometry methods. This second volume of Spectroscopic Ellipsometry for Photovoltaics presents various applications of the ellipsometry technique for device analyses, including optical/recombination loss analyses, real-time control and on-line monitoring of solar cell structures, and large-area structural mapping. Furthermore, this book describes the optical constants of 148 solar cell component layers, covering a broad range of materials from semiconductor light absorbers (inorganic, organic and hybrid perovskite semiconductors) to transparent conductive oxides and metals. The tabulated and completely parameterized optical constants described in this book are the most current resource that is vital for device simulations and solar cell structural analyses.


Amorphous Si solar cells CIGS growth ananlysis Compound solar cells Hybrid perovskites Microcrystalline Si solar cells Nanomaterial-based solar cells Optical analysis of solar cells Optical constants of solar materials Organic solar cells Si heterojunction solar cells Spectroscopic ellipsometry

Editors and affiliations

  • Hiroyuki Fujiwara
    • 1
  • Robert W. Collins
    • 2
  1. 1.Department of Electrical, Electronic and Computer EngineeringGifu UniversityGifuJapan
  2. 2.Department of Physics and AstronomyThe University of ToledoToledoUSA

Bibliographic information

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