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Radiation Hardened CMOS Integrated Circuits for Time-Based Signal Processing

  • Jeffrey Prinzie
  • Michiel Steyaert
  • Paul Leroux
Book

Part of the Analog Circuits and Signal Processing book series (ACSP)

Table of contents

  1. Front Matter
    Pages i-xxv
  2. Jeffrey Prinzie, Michiel Steyaert, Paul Leroux
    Pages 1-20
  3. Jeffrey Prinzie, Michiel Steyaert, Paul Leroux
    Pages 21-42
  4. Jeffrey Prinzie, Michiel Steyaert, Paul Leroux
    Pages 43-70
  5. Jeffrey Prinzie, Michiel Steyaert, Paul Leroux
    Pages 71-96
  6. Jeffrey Prinzie, Michiel Steyaert, Paul Leroux
    Pages 97-121
  7. Jeffrey Prinzie, Michiel Steyaert, Paul Leroux
    Pages 123-143
  8. Jeffrey Prinzie, Michiel Steyaert, Paul Leroux
    Pages 145-154
  9. Jeffrey Prinzie, Michiel Steyaert, Paul Leroux
    Pages 155-164
  10. Back Matter
    Pages 165-183

About this book

Introduction

This book presents state-of-the-art techniques for radiation hardened high-resolution Time-to-Digital converters and low noise frequency synthesizers. Throughout the book, advanced degradation mechanisms and error sources are discussed and several ways to prevent such errors are presented. An overview of the prerequisite physics of nuclear interactions is given that has been compiled in an easy to understand chapter. The book is structured in a way that different hardening techniques and solutions are supported by theory and experimental data with their various tradeoffs.

  • Based on leading-edge research, conducted in collaboration between KU Leuven and CERN, the European Center for Nuclear Research
  • Describes in detail advanced techniques to harden circuits against ionizing radiation
  • Provides a practical way to learn and understand radiation effects in time-based circuits
  • Includes an introduction to the underlying physics, circuit design, and advanced techniques accompanied with experimental data

Keywords

Radiation-Tolerant Circuits Radiation-hardened circuits Soft errors Fault-tolerant design Radiation Effects in CMOS

Authors and affiliations

  • Jeffrey Prinzie
    • 1
  • Michiel Steyaert
    • 2
  • Paul Leroux
    • 3
  1. 1.KU LeuvenGeelBelgium
  2. 2.KU LeuvenHeverleeBelgium
  3. 3.KU LeuvenGeelBelgium

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-319-78616-2
  • Copyright Information Springer International Publishing AG, part of Springer Nature 2018
  • Publisher Name Springer, Cham
  • eBook Packages Engineering Engineering (R0)
  • Print ISBN 978-3-319-78615-5
  • Online ISBN 978-3-319-78616-2
  • Series Print ISSN 1872-082X
  • Series Online ISSN 2197-1854
  • Buy this book on publisher's site
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