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© 2018

Kelvin Probe Force Microscopy

From Single Charge Detection to Device Characterization

  • Sascha Sadewasser
  • Thilo Glatzel
Book

Part of the Springer Series in Surface Sciences book series (SSSUR, volume 65)

Table of contents

  1. Front Matter
    Pages i-xxiv
  2. Experimental Methods and Technical Aspects

    1. Front Matter
      Pages 1-1
    2. Sascha Sadewasser, Thilo Glatzel
      Pages 3-22
    3. Yoichi Miyahara, Peter Grütter
      Pages 23-47
    4. Stephen Jesse, Liam Collins, Sabine Neumayer, Suhas Somnath, Sergei V. Kalinin
      Pages 49-99
    5. Kei Kobayashi, Hirofumi Yamada
      Pages 101-118
    6. Sascha Sadewasser, Nicoleta Nicoara
      Pages 119-143
  3. Data Interpretation and Theoretical Aspects

    1. Front Matter
      Pages 145-145
    2. Philipp Rahe, Hagen Söngen
      Pages 147-170
    3. Hagen Söngen, Philipp Rahe, Ralf Bechstein, Angelika Kühnle
      Pages 171-200
    4. Leo Polak, Rinke J. Wijngaarden
      Pages 227-247
  4. Application to Device Characterization

    1. Front Matter
      Pages 249-249
    2. Evgheni Strelcov, Mahshid Ahmadi, Sergei V. Kalinin
      Pages 251-329
    3. Alex Henning, Yossi Rosenwaks
      Pages 367-389
    4. Liam Collins, Stefan A.L. Weber, Brian J. Rodriguez
      Pages 391-433
  5. Atomic Scale Experiments

    1. Front Matter
      Pages 435-435
    2. Yan Jun Li, Haunfei Wen, Zong Min Ma, Lili Kou, Yoshitaka Naitoh, Yasuhiro Sugawara
      Pages 437-463
    3. Michael Ellner, Pablo Pou, Ruben Perez
      Pages 465-497

About this book

Introduction

This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics.

In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors’ previous volume “Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,” presents new and complementary topics.

It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.


Keywords

Scanning Kelvin Probe Microscopy Electrostatic Force Microscopy KPFM techniques for liquid environment KPFM with atomic resolution KPFM with atomic resolution electrostatic field of a cantilever Kelvin spectroscopy of single molecules

Editors and affiliations

  • Sascha Sadewasser
    • 1
  • Thilo Glatzel
    • 2
  1. 1.International Iberian Nanotechnology LaboratoryBragaPortugal
  2. 2.Department of PhysicsUniversity of BaselBaselSwitzerland

About the editors

Sascha Sadewasser has been the Principal Investigator of the Laboratory for Nanostructured Solar Cells at INL - International Iberian Nanotechnology Laboratory (Portugal) since 2011. In 1999, he received his PhD from Washington University in St. Louis (USA). After a post-doc at Hahn-Meitner Institut Berlin and a Ramón y Cajal fellowship at the CNM in Barcelona (Spain), he was a group leader at the Helmholtz-Zentrum Berlin (Germany). Sascha’s research focuses on the development of nanostructures for and of chalcopyrite materials for the improvement of solar cells. He is an expert on scanning probe microscopy, and specifically Kelvin probe force microscopy, applied to semiconductor and solar cell research. His work has provided important insights into the physics of grain boundaries in polycrystalline Cu(in,Ga)Se2 thin-film solar cells. He has published over 80 peer-reviewed papers and 5 book chapters, and has been granted 3 patents. He is also a member of several scientific committees and evaluation boards.

Thilo Glatzel is leader of the force microscopy group which is part of the research group from Prof. E. Meyer at the University of Basel. He is co-author of 115 international publications, contributed several book chapters, co-edited the first volume of the book on Kelvin probe force microscopy (KPFM), and has more than 100 contributions to international scientific conferences. During his dissertation at the Helmholtz-Zentrum Berlin he investigated interfaces and surfaces of chalcopyrite thin film solar cells based on Cu(Ga,In)(S,Se)2 absorber materials by KPFM. His work is now focused on the development of instruments and measurement techniques for high resolution scanning probe microscopy and the analysis of molecules and insulating and semiconducting surfaces at the nanometer scale. The expertise of the group is clearly focused on the nanoscale analysis and preparation of highly ordered surfaces down to the molecular and atomic scale, however with a focus on optoelectronic processes. 

Bibliographic information