Table of contents
About this book
This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics.
In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors’ previous volume “Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,” presents new and complementary topics.
It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.
Editors and affiliations
- Book Title Kelvin Probe Force Microscopy
- Book Subtitle From Single Charge Detection to Device Characterization
- Series Title Springer Series in Surface Sciences
- Series Abbreviated Title Springer Ser. Surface Sc.
- DOI https://doi.org/10.1007/978-3-319-75687-5
- Copyright Information Springer International Publishing AG, part of Springer Nature 2018
- Publisher Name Springer, Cham
- eBook Packages Physics and Astronomy Physics and Astronomy (R0)
- Hardcover ISBN 978-3-319-75686-8
- Softcover ISBN 978-3-030-09298-6
- eBook ISBN 978-3-319-75687-5
- Series ISSN 0931-5195
- Series E-ISSN 2198-4743
- Edition Number 1
- Number of Pages XXIV, 521
- Number of Illustrations 40 b/w illustrations, 194 illustrations in colour
Spectroscopy and Microscopy
Surfaces and Interfaces, Thin Films
Nanotechnology and Microengineering
Characterization and Evaluation of Materials
Measurement Science and Instrumentation
- Buy this book on publisher's site