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Electromigration Inside Logic Cells

Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS

  • Gracieli Posser
  • Sachin S. Sapatnekar
  • Ricardo Reis

Table of contents

  1. Front Matter
    Pages i-xx
  2. Gracieli Posser, Sachin S. Sapatnekar, Ricardo Reis
    Pages 1-10
  3. Gracieli Posser, Sachin S. Sapatnekar, Ricardo Reis
    Pages 11-32
  4. Gracieli Posser, Sachin S. Sapatnekar, Ricardo Reis
    Pages 33-43
  5. Gracieli Posser, Sachin S. Sapatnekar, Ricardo Reis
    Pages 45-58
  6. Gracieli Posser, Sachin S. Sapatnekar, Ricardo Reis
    Pages 59-62
  7. Gracieli Posser, Sachin S. Sapatnekar, Ricardo Reis
    Pages 63-91
  8. Gracieli Posser, Sachin S. Sapatnekar, Ricardo Reis
    Pages 93-98
  9. Gracieli Posser, Sachin S. Sapatnekar, Ricardo Reis
    Pages 99-101
  10. Back Matter
    Pages 103-118

About this book

Introduction

This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. They show in this book that an interconnect inside a cell can fail reducing considerably the circuit lifetime and they demonstrate a methodology to optimize the lifetime of circuits, by placing the output, Vdd and Vss pin of the cells in the less critical regions, where the electromigration effects are reduced. Readers will be enabled to apply this methodology only for the critical cells in the circuit, avoiding impact in the circuit delay, area and performance, thus increasing the lifetime of the circuit without loss in other characteristics. 

Keywords

Circuit reliability Electromigration Techniques Electromigration Modeling cell-internal signal electromigration cell-internal electromigration at 22nm

Authors and affiliations

  • Gracieli Posser
    • 1
  • Sachin S. Sapatnekar
    • 2
  • Ricardo Reis
    • 3
  1. 1.Instituto de Informática - PPGC/PGMicroUniversidade Federal do Rio Grande do Sul (UFRGS)Porto AlegreBrazil
  2. 2.Department of Electrical and Computer EngineeringUniversity of MinnesotaMinneapolisUSA
  3. 3.Instituto de Informática - PPGC/PGMicroUniversidade Federal do Rio Grande do Sul (UFRGS)Porto AlegreBrazil

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-319-48899-8
  • Copyright Information Springer International Publishing AG 2017
  • Publisher Name Springer, Cham
  • eBook Packages Engineering
  • Print ISBN 978-3-319-48898-1
  • Online ISBN 978-3-319-48899-8
  • Buy this book on publisher's site
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