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Metrology and Physical Mechanisms in New Generation Ionic Devices

  • Umberto┬áCelano

Part of the Springer Theses book series (Springer Theses)

Table of contents

  1. Front Matter
    Pages i-xxiv
  2. Umberto Celano
    Pages 1-9
  3. Umberto Celano
    Pages 11-45
  4. Umberto Celano
    Pages 47-86
  5. Umberto Celano
    Pages 115-142
  6. Umberto Celano
    Pages 143-150
  7. Umberto Celano
    Pages 151-160
  8. Back Matter
    Pages 161-175

About this book

Introduction

The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed. 

Keywords

Resistive Switching Conductive Filaments Scalpel SPM Ionic Devices Conductive Bridging Memory CBRAM RRAM C-AFM AFM Tomography 3D Metrology

Authors and affiliations

  • Umberto┬áCelano
    • 1
  1. 1.Material and Component AnalysisimecLeuvenBelgium

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-319-39531-9
  • Copyright Information Springer International Publishing Switzerland 2016
  • Publisher Name Springer, Cham
  • eBook Packages Physics and Astronomy
  • Print ISBN 978-3-319-39530-2
  • Online ISBN 978-3-319-39531-9
  • Series Print ISSN 2190-5053
  • Series Online ISSN 2190-5061
  • Buy this book on publisher's site
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