Soft Error Mechanisms, Modeling and Mitigation

  • Selahattin Sayil

Table of contents

  1. Front Matter
    Pages i-xi
  2. Selahattin Sayil
    Pages 1-10
  3. Selahattin Sayil
    Pages 11-18
  4. Selahattin Sayil
    Pages 31-48
  5. Selahattin Sayil
    Pages 75-84
  6. Selahattin Sayil
    Pages 85-93
  7. Back Matter
    Pages 105-105

About this book


This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.  


Integrated Circuit Reliability Soft Errors Soft Error Mechanisms Soft Error Modeling Soft Error Mitigation

Authors and affiliations

  • Selahattin Sayil
    • 1
  1. 1.HoustonUSA

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