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© 2016

3D Stacked Chips

From Emerging Processes to Heterogeneous Systems

  • Ibrahim (Abe) M. Elfadel
  • Gerhard Fettweis

Benefits

  • Provides single-source reference to the latest research in 3D optoelectronic integration: process, devices, and systems;

  • Explains the use of wireless 3D integration to improve 3D IC reliability and yield;

  • Describes techniques for monitoring and mitigating thermal behavior in 3D ICs;

  • Includes discussion of 3D integration of high-density power sources and novel NVM.

Book

Table of contents

  1. Front Matter
    Pages i-xxiii
  2. Electrical 3D Integration

    1. Front Matter
      Pages 1-2
    2. Sebastian Killge, Sujay Charania, Johann W. Bartha
      Pages 3-7
    3. Sebastian Killge, Volker Neumann, Johann W. Bartha
      Pages 9-28
    4. Johannes Görner, Dennis Walter, Michael Haas, Sebastian Höppner
      Pages 29-67
    5. Tobias Seifert, Friedrich Pauls, Gerhard Fettweis
      Pages 69-83
    6. Sebastian Höppner, Dennis Walter, René Schüffny
      Pages 101-128
    7. Nazek El-Atab, Ali K. Okyay, Ammar Nayfeh
      Pages 129-156
    8. Sami ur Rehman, Ayman Shabra
      Pages 157-173
    9. Love Cederström
      Pages 175-194
    10. Puskar Budhathoki, Johann Knechtel, Andreas Henschel, Ibrahim (Abe) M. Elfadel
      Pages 195-209
  3. Photonic and Opto-Electronic 3D Integration

    1. Front Matter
      Pages 211-212
    2. Niels Neumann, Ronny Henker, Marcus S. Dahlem
      Pages 213-220
    3. Sebastian Killge, Niels Neumann, Dirk Plettemeier, Johann W. Bartha
      Pages 221-234
    4. Seyedreza Hosseini, Michael Haas, Dirk Plettemeier, Kambiz Jamshidi
      Pages 235-253
    5. Peng Xing, Jaime Viegas
      Pages 283-295
    6. Ronny Henker, Guido Belfiore, Laszlo Szilagyi, Frank Ellinger
      Pages 297-308

About this book

Introduction

This book explains for readers how 3D chip stacks promise to increase the level of on-chip integration, and to design new heterogeneous semiconductor devices that combine chips of different integration technologies (incl. sensors) in a single package of the smallest possible size.  The authors focus on heterogeneous 3D integration, addressing some of the most important challenges in this emerging technology, including contactless, optics-based, and carbon-nanotube-based 3D integration, as well as signal-integrity and thermal management issues in copper-based 3D integration. Coverage also includes the 3D heterogeneous integration of power sources, photonic devices, and non-volatile memories based on new materials systems.
 
•Provides single-source reference to the latest research in 3D optoelectronic integration: process, devices, and systems;
•Explains the use of wireless 3D integration to improve 3D IC reliability and yield;
•Describes techniques for monitoring and mitigating thermal behavior in 3D ICs;
•Includes discussion of 3D integration of high-density power sources and novel NVM.

Keywords

3D Heterogeneous Integration 3D Integrated Circuits 3D Optoelectronic Integration 3D Process Development TSV Modeling and Circuit Techniques Thermal Management of 3D ICs Three-dimensional Integrated Circuit Design

Editors and affiliations

  • Ibrahim (Abe) M. Elfadel
    • 1
  • Gerhard Fettweis
    • 2
  1. 1.Masdar Institute of Science & TechnAbu DhabiUnited Arab Emirates
  2. 2.Vodafone Chair Mobile CommunicationDresdenGermany

About the editors

 Ibrahim (Abe) M. Elfadel has 15 years of industrial experience in the research, development and deployment of advanced computer-aided design (CAD) tools and methodologies for deep-submicron, high-performance digital designs. Most recently, he played a key role in the development and deployment of IBM’s next-generation layout verification tools for the ultra-deep submicron CMOS technology nodes. Dr. Elfadel is the recipient of six Invention Achievement Awards, an Outstanding Technical Achievement Award and a Research Division Award, all from IBM, for his contributions in the area of VLSI CAD.  He is currently serving as an Associate Editor for the IEEE Transactions on Computer-Aided Design for Integrated Circuits and Systems.

Gerhard Fettweis earned his Ph.D. under H. Meyr's supervision from RWTH Aachen in 1990. After one year at IBM Research in San Jose, CA he moved to TCSI Inc., Berkeley, CA. Since 1994 he is Vodafone Chair Professor at TU Dresden, Germany, with currently 20 companies from Asia/Europe/US sponsoring his research on wireless transmission and chip design. He coordinates 2 DFG centers at TU Dresden, cfAED and HAEC. Gerhard is IEEE Fellow, member of acatech, has an honorary doctorate from TU Tampere, and has received multiple awards. In Dresden he has spun-out ten start-ups, and setup funded projects of more than EUR 1/3 billion volume. He has helped organized IEEE conferences, most notably as TPC Chair of IEEE ICC 2009, IEEE TTM 2012, and Ge

neral Chair of VTC Spring 2013. He remains active within IEEE.

 

Bibliographic information

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Reviews

“The book is valuable as a learning tool for 3D stacked chips through TSVs … . a valuable addition to a scientific library, as well as served as good introduction for device reliability engineers or specialists and industrials involved in the field of 3D stacking in wafer fabrication and integrated circuit design. … highly recommended for people who desire a better understanding of the theory and practice of 3D TSVs and technical considerations in 3D chips floorplanning, modeling and characterization.” (Chong Leong Gan and Uda Hashim, Microelectronics Reliability, Vol. 63, August, 2016)