© 2020

Advanced Computing in Electron Microscopy


Table of contents

  1. Front Matter
    Pages i-xii
  2. Earl J. Kirkland
    Pages 1-7
  3. Earl J. Kirkland
    Pages 9-36
  4. Earl J. Kirkland
    Pages 37-80
  5. Earl J. Kirkland
    Pages 81-98
  6. Earl J. Kirkland
    Pages 99-141
  7. Earl J. Kirkland
    Pages 197-239
  8. Earl J. Kirkland
    Pages 241-272
  9. Back Matter
    Pages 273-354

About this book


This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.


fast fourier projection theorem fast fourier transform multislice methods scanning transmission electron microscope theory of electron image formation transmission electron microscopy image interpretation parallel image processing ABF imaging

Authors and affiliations

  1. 1.School of Applied & Engineering PhysicsCornell UniversityIthacaUSA

About the authors

Earl J. Kirkland graduated from Case Western Reserve University with a BS in Physics, and from Cornell University with a PhD in Applied Physics. He currently teaches in the Applied Physics Department at Cornell. 

Bibliographic information