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Springer Handbook of Microscopy

  • Peter W. Hawkes
  • John C. H. Spence
Book

Part of the Springer Handbooks book series (SHB)

Table of contents

  1. Front Matter
    Pages 1-1
  2. Electron and Ion Microscopy

    1. Front Matter
      Pages 1-1
    2. Angus I. Kirkland, Shery L.-Y. Chang, John L. Hutchison
      Pages 2-2
    3. Peter D. Nellist
      Pages 2-2
    4. Frances M. Ross, Andrew M. Minor
      Pages 2-2
    5. Jürgen Plitzko, Wolfgang P. Baumeister
      Pages 2-2
    6. Natasha Erdman, David C. Bell, Rudolf Reichelt
      Pages 2-2
    7. Gianluigi Botton, Sagar Prabhudev
      Pages 2-2
    8. Geoffrey H. Campbell, Joseph T. McKeown, Melissa K. Santala
      Pages 2-2
    9. Ernst Bauer
      Pages 2-2
    10. Jun Feng, Andreas Scholl
      Pages 2-2
    11. Sandra Van Aert
      Pages 2-2
    12. Peter W. Hawkes, Ondrej L. Krivanek
      Pages 2-2
    13. Gregor Hlawacek
      Pages 2-2
    14. Thomas F. Kelly
      Pages 2-2
  3. Holography, Ptychography and Diffraction

    1. Front Matter
      Pages 1-1
    2. Rafal E. Dunin-Borkowski, András Kovács, Takeshi Kasama, Martha R. McCartney, David J. Smith
      Pages 2-2
    3. John Rodenburg, Andrew Maiden
      Pages 2-2
    4. Jian-Min Zuo
      Pages 2-2
    5. Pietro Musumeci, Renkai Li
      Pages 2-2
    6. John C. H. Spence
      Pages 2-2
  4. Photon-based Microscopy

    1. Front Matter
      Pages 1-1
    2. Alberto Diaspro, Paolo Bianchini, Francesca Cella Zanacchi, Luca Lanzanò, Giuseppe Vicidomini, Michele Oneto et al.
      Pages 2-2
    3. Steffen J. Sahl, Andreas Schönle, Stefan W. Hell
      Pages 2-2
    4. Chris Jacobsen, Malcolm Howells, Tony Warwick
      Pages 2-2
    5. Angela S.P. Lin, Stuart R. Stock, Robert E. Guldberg
      Pages 2-2
  5. Applied Microscopy

    1. Front Matter
      Pages 1-1
    2. Bryan D. Huey, Justin Luria, Dawn A. Bonnell
      Pages 2-2
    3. Rowan K. Leary, Paul A. Midgley
      Pages 2-2
    4. Kazuhiro Fujita, Mohammad H. Hamidian, Peter O. Sprau, Stephen D. Edkins, J.C. Séamus Davis
      Pages 2-2
    5. Yanhang Ma, Lu Han, Zheng Liu, Alvaro Mayoral, Isabel Díaz, Peter Oleynikov et al.
      Pages 2-2
    6. Matthias W. Amrein, Dimitar Stamov
      Pages 2-2
    7. Benjamin J. Jones
      Pages 2-2
  6. Back Matter
    Pages 1-1

About this book

Introduction

This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology.

Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. 

In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.

Keywords

scanning electron microscopy, SEM transmission electron microscopy, TEM atomic force microscopy, AFM ptychography holography scanning transmission electron microscope, STEM super.resolution fluorescence microscopy low energy electron microscopy, LEEM cryo-electron micvroscopy in biology aberration correctons, monochromators, spectrometers super-resolution fluorescence microscopy

Editors and affiliations

  1. 1.CEMES-CNRSToulouseFrance
  2. 2.Dept. of PhysicsArizona State UniversityTempe, AZUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-030-00069-1
  • Copyright Information Springer Nature Switzerland AG 2019
  • Publisher Name Springer, Cham
  • eBook Packages Chemistry and Materials Science
  • Print ISBN 978-3-030-00068-4
  • Online ISBN 978-3-030-00069-1
  • Series Print ISSN 2522-8692
  • Series Online ISSN 2522-8706
  • Buy this book on publisher's site
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