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Electron Probe Quantitation

  • K. F. J. Heinrich
  • Dale E. Newbury

Table of contents

  1. Front Matter
    Pages i-viii
  2. Kurt F. J. Heinrich
    Pages 9-18
  3. R. L. Myklebust, D. E. Newbury
    Pages 177-190
  4. R. B. Marinenko
    Pages 251-260
  5. J. A. Small, D. E. Newbury, R. L. Myklebust, C. E. Fiori, A. A. Bell, K. F. J. Heinrich
    Pages 317-334
  6. D. E. Newbury, R. B. Marinenko, R. L. Myklebust, D. S. Bright
    Pages 335-369
  7. D. B. Williams, J. I. Goldstein
    Pages 371-398
  8. Back Matter
    Pages 399-400

About this book

Introduction

In 1968, the National Bureau of Standards (NBS) published Special Publication 298 "Quantitative Electron Probe Microanalysis," which contained proceedings of a seminar held on the subject at NBS in the summer of 1967. This publication received wide interest that continued through the years far beyond expectations. The present volume, also the result of a gathering of international experts, in 1988, at NBS (now the National Institute of Standards and Technology, NIST), is intended to fulfill the same purpose. After years of substantial agreement on the procedures of analysis and data evaluation, several sharply differentiated approaches have developed. These are described in this publi­ cation with all the details required for practical application. Neither the editors nor NIST wish to endorse any single approach. Rather, we hope that their exposition will stimulate the dialogue which is a prerequisite for technical progress. Additionally, it is expected that those active in research in electron probe microanalysis will appreciate more clearly the areas in which further investigations are warranted.

Keywords

EPMA X-ray electron electron microscope electron microscopy experiment instruments oxygen particles tracer

Editors and affiliations

  • K. F. J. Heinrich
    • 1
  • Dale E. Newbury
    • 1
  1. 1.Chemical Science and Technology LaboratoryNational Institute of Standards and TechnologyGaithersburgUSA

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