Overview
- Editors:
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Gavin R. Mallett
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Marie J. Fay
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William M. Mueller
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Table of contents (47 papers)
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- K. Das Gupta, Herbert W. Schnopper, Albert E. Metzger, Rex A. Shields
Pages 221-241
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- Raymond J. Donahue, Leonid V. Azároff
Pages 251-258
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- Richard M. Ingersoll, Jack E. Taylor, Donald H. Derouin
Pages 273-288
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- H. Yakowitz, D. L. Vieth, K. F. J. Heinrich, R. E. Michaelis
Pages 289-303
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- V. G. Scotti, J. M. Johnson, R. T. Cunningham
Pages 314-322
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- Donald M. Koffman, Sheldon H. Moll
Pages 323-328
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- David W. Fischer, William L. Baun
Pages 329-343
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- Franklin D. Davidson, Ralph W. G. Wyckoff
Pages 344-353
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- D. W. Wilbur, J. W. Gofman
Pages 354-364
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- E. W. White, H. A. McKinstry
Pages 376-392
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- Gavin R. Mallett, Marie J. Fay, William M. Mueller
Pages 393-397
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- J. B. Nicholson, M. F. Hasler
Pages 420-429
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About this book
The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. This conference, sponsored by the Metallurgy Division of the Denver Research Institute, University of Denver, was held on August 24,25, and 26, 1965, at the Albany Hotel in Denver, Colorado. Of the 56 papers presented at the conference, 46 are included in this volume; also included is an open discussion held on the effects of chemical com bination on X-ray spectra. The subjects presented represent a broad scope of applications of X-rays to a variety of fields and disciplines. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis. Also included were sessions on X-ray diffraction and fluor escence analysis. There were several papers on special topics, including X-ray topography and X-ray absorption fine-structure analysis. William L. Baun contributed considerable effort toward the conference by organizing the session on the effect of chemical combination on X-ray spectra fine structure. A special session was established through the excellent efforts of S. P. Ong on the uses and applica tions of soft X-rays in fluorescent analysis. We offer our sincere thanks to these men, for these two special sessions contributed greatly to the success of the conference.
