Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces

  • P. K. Larsen
  • P. J. Dobson

Part of the NATO ASI Series book series (NSSB, volume 188)

Table of contents

  1. Front Matter
    Pages i-xiii
  2. Surface Structural Determination

    1. Front Matter
      Pages 1-1
    2. Experimental

    3. Theory

      1. M. G. Knibb, P. A. Maksym
        Pages 43-62
      2. S. Y. Tong, T. C. Zhao, H. C. Poon
        Pages 63-75
    4. Inelastic Effects

      1. A. L. Bleloch, A. Howie, R. H. Milne, M. G. Walls
        Pages 77-89
  3. Resonance and Channeling Effects

  4. Disorders and Steps in Electron Diffraction

    1. Front Matter
      Pages 137-137
    2. M. G. Lagally, D. E. Savage, M. C. Tringides
      Pages 139-174
    3. M. Henzler
      Pages 193-199
    4. B. Bölger, P. K. Larsen, G. Meyer Ehmsen
      Pages 201-209
    5. M. Albrecht, G. Meyer-Ehmsen
      Pages 211-216
    6. A. J. Hoeven, J. S. C. Kools, J. Aarts, P. C. Zalm
      Pages 217-224
  5. Convergent Beam Diffraction

  6. Reflection Electron Microscopy

  7. Electron Diffraction Studies of Growth

    1. Front Matter
      Pages 395-395
    2. Semiconductors

      1. B. A. Joyce, J. H. Neave, J. Zhang, P. J. Dobson
        Pages 397-417
      2. J. Aarts, P. K. Larsen
        Pages 449-461
      3. M. Horn, U. Gotter, M. Henzler
        Pages 463-473
    3. Metals

      1. G. Lilienkamp, C. Kozioł, E. Bauer
        Pages 489-499
    4. Theory

      1. M. C. Tringides, M. G. Lagally
        Pages 523-536
  8. Back Matter
    Pages 539-541

About this book


This volume contains the papers presented at the NATO Advanced Research Workshop in "Reflection High Energy Electron Diffraction and Reflection Electron Imaging of Surfaces" held at the Koningshof conference center, Veldhoven, the Netherlands, June 15-19, 1987. The main topics of the workshop, Reflection High Energy Electron Diffraction (RHEED) and Reflection Electron Microscopy (REM), have a common basis in the diffraction processes which high energy electrons undergo when they interact with solid surfaces at grazing angles. However, while REM is a new technique developed on the basis of recent advances in transmission electron microscopy, RHEED is an old method in surface crystallography going back to the discovery of electron diffraction in 1927 by Davisson and Germer. Until the development of ultra high vacuum techniques in the 1960's made instruments using slow electrons more accessable, RHEED was the dominating electron diffraction technique. Since then and until recently the method of Low Energy Electron Diffraction (LEED) largely surpassed RHEED in popularity in surface studies. The two methods are closely related of course, each with its own specific advantages. The grazing angle geometry of RHEED has now become a very useful feature because this makes it ideally suited for combination with the thin growth technique of Molecular Beam Epitaxy (MBE). This combination allows in-situ studies of freshly grown and even growing surfaces, opening up new areas of research of both fundamental and technological importance.


crystal crystallography electron electron microscopy microscopy transmission electron microscopy

Editors and affiliations

  • P. K. Larsen
    • 1
  • P. J. Dobson
    • 2
  1. 1.Philips Research LaboratoriesEindhovenThe Netherlands
  2. 2.Philips Research LaboratoriesRedhillUK

Bibliographic information

  • DOI
  • Copyright Information Springer-Verlag US 1988
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4684-5582-3
  • Online ISBN 978-1-4684-5580-9
  • Series Print ISSN 0258-1221
  • Buy this book on publisher's site
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