Advances in Acoustic Microscopy

  • Andrew Briggs
  • Walter Arnold

Part of the Advances in Acoustic Microscopy book series (AAMI, volume 2)

Table of contents

  1. Front Matter
    Pages i-xxiii
  2. Marc Lethiecq, Marceau Berson, Guy Feuillard, Frederic Patat
    Pages 39-102
  3. Yusuke Tsukahara, Noritaka Nakaso, Katsumi Ohira, Masa-aki Yanaka
    Pages 103-165
  4. Wolfgang Grill, Kristian Hillmann, Karl Ulrich Würz, Joachim Wesner
    Pages 167-218
  5. Mathias Fink, Claire Prada
    Pages 219-251
  6. Back Matter
    Pages 253-264

About this book


This is the second volume of Advances in Acoustic Microscopy. It continues the aim of presenting applications and developments of techniques that are related to high-resolution acoustic imaging. We are very grateful to the authors who have devoted considerable time to preparing these chapters, each of which describes a field of growing importance. Laboratories that have high-performance acoustic microscopes are frequently asked to examine samples for which the highest available resolution is not necessary, and the ability to penetrate opaque layers is more significant. Such applications can be thought of as bridging the gap be­ tween acoustic microscopy at low gigahertz frequencies, and on the one hand nondestructive testing of materials at low megahertz frequencies and on the other hand medical ultrasonic imaging at low megahertz frequencies. Commercial acoustic microscopes are becoming increasingly available and popular for such applications. We are therefore delighted to be able to begin the volume with chapters from each of those two fields. The first chapter, by Gabriele Pfannschmidt, describes uses of acoustic microscopy in the semiconductor industry. It provides a splendid balance to the opening chapter of Volume 1, which came from a national research center, being written from within a major European electronics industry itself. Dr Pfann­ schmidt describes the use of two quite different types of acoustic microscopes, and points out the advantages of each for specific purposes.


biology materials science microscopy surfaces ultrasound

Editors and affiliations

  • Andrew Briggs
    • 1
  • Walter Arnold
    • 2
  1. 1.University of OxfordOxfordUK
  2. 2.Fraunhofer Institute for Nondestructive TestingSaarbrückenGermany

Bibliographic information

  • DOI
  • Copyright Information Springer Science+Business Media New York 1996
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4613-7682-8
  • Online ISBN 978-1-4615-5851-4
  • Buy this book on publisher's site
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