About this book
This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements.
- Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters;
- Includes built-in testing techniques, linked to current industrial trends;
- Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches;
- Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques.
- DOI https://doi.org/10.1007/978-1-4614-2296-9
- Copyright Information Springer Science+Business Media New York 2012
- Publisher Name Springer, Boston, MA
- eBook Packages Engineering
- Print ISBN 978-1-4614-2295-2
- Online ISBN 978-1-4614-2296-9
- Buy this book on publisher's site