Modeling Nanoscale Imaging in Electron Microscopy

  • Thomas Vogt
  • Wolfgang Dahmen
  • Peter Binev

Part of the Nanostructure Science and Technology book series (NST)

Table of contents

  1. Front Matter
    Pages i-ix
  2. Michael Dickson
    Pages 1-9
  3. N. D. Browning, J. P. Buban, M. Chi, B. Gipson, M. Herrera, D. J. Masiel et al.
    Pages 11-40
  4. Sarah J. Haigh, Angus I. Kirkland
    Pages 41-72
  5. Peter Binev, Wolfgang Dahmen, Ronald DeVore, Philipp Lamby, Daniel Savu, Robert Sharpley
    Pages 73-126
  6. Peter Binev, Francisco Blanco-Silva, Douglas Blom, Wolfgang Dahmen, Philipp Lamby, Robert Sharpley et al.
    Pages 127-145
  7. Amit Singer, Yoel Shkolnisky
    Pages 147-177
  8. Back Matter
    Pages 179-182

About this book


Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing


Analysis Dahmen Electron Imaging Microscopy Modeling Nanoscale Resolution STEM TEM Vogt

Editors and affiliations

  • Thomas Vogt
    • 1
  • Wolfgang Dahmen
    • 2
  • Peter Binev
    • 3
  1. 1.NanoCenter, Dept. of Chemistry & Biochem.University of South CarolinaColumbiaUSA
  2. 2., Dept. of MathematicsInst. Geometrie & Praktische Mathemat.AachenGermany
  3. 3.Interdisciplin. Mathematics Instit., Dept. MathematicsUniversity of South CarolinaColumbiaUSA

Bibliographic information

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