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© 1987

Residual Stress

Measurement by Diffraction and Interpretation

Book

Part of the Materials Research and Engineering book series (MATERIALS)

Table of contents

  1. Front Matter
    Pages I-X
  2. Ismail C. Noyan, Jerome B. Cohen
    Pages 1-12
  3. Ismail C. Noyan, Jerome B. Cohen
    Pages 13-46
  4. Ismail C. Noyan, Jerome B. Cohen
    Pages 47-74
  5. Ismail C. Noyan, Jerome B. Cohen
    Pages 75-116
  6. Ismail C. Noyan, Jerome B. Cohen
    Pages 117-163
  7. Ismail C. Noyan, Jerome B. Cohen
    Pages 211-229
  8. Ismail C. Noyan, Jerome B. Cohen
    Pages 230-247
  9. Back Matter
    Pages 248-276

About this book

Keywords

Absorption Fitting Goniometer Hardware Industrie Information Kristallographie Monochromator Peak Profil Röntgenstrahlung Service Software Temperatur deformation CIM Filter Fundament Phase Transformation

Authors and affiliations

  1. 1.Thomas J. Watson Research CenterIBMYorktown HeightsUSA
  2. 2.Dept. of Materials Science and Engineering, The Technological InstituteNorthwestern UniversityEvanstonUSA

Bibliographic information

  • Book Title Residual Stress
  • Book Subtitle Measurement by Diffraction and Interpretation
  • Authors Ismail C. Noyan
    Jerome B. Cohen
  • Series Title Materials Research and Engineering
  • DOI https://doi.org/10.1007/978-1-4613-9570-6
  • Copyright Information Springer-Verlag New York Inc. 1987
  • Publisher Name Springer, New York, NY
  • eBook Packages Springer Book Archive
  • Hardcover ISBN 978-0-387-96378-5
  • Softcover ISBN 978-1-4613-9571-3
  • eBook ISBN 978-1-4613-9570-6
  • Edition Number 1
  • Number of Pages X, 276
  • Number of Illustrations 0 b/w illustrations, 0 illustrations in colour
  • Topics Characterization and Evaluation of Materials
  • Buy this book on publisher's site
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