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Scanning Electron Microscopy and X-Ray Microanalysis

A Text for Biologist, Materials Scientist, and Geologists

  • Joseph I. Goldstein
  • Dale E. Newbury
  • Patrick Echlin
  • David C. Joy
  • Charles Fiori
  • Eric Lifshin

Table of contents

  1. Front Matter
    Pages i-xiii
  2. Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin
    Pages 1-18
  3. Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin
    Pages 19-51
  4. Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin
    Pages 53-122
  5. Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin
    Pages 123-204
  6. Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin
    Pages 205-273
  7. Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin
    Pages 275-304
  8. Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin
    Pages 305-392
  9. Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin
    Pages 393-445
  10. Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin
    Pages 447-459
  11. Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin
    Pages 461-494
  12. Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin
    Pages 495-539
  13. Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin
    Pages 541-587
  14. Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin
    Pages 589-614
  15. Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin
    Pages 615-647
  16. Back Matter
    Pages 649-673

About this book

Introduction

This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter­ actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru­ ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.

Keywords

Hydra X-ray alloy ceramics deformation electron microscopy electron optics fluorescence materials science metals microscopy modeling polymer scanning electron microscopy

Authors and affiliations

  • Joseph I. Goldstein
    • 1
  • Dale E. Newbury
    • 2
  • Patrick Echlin
    • 3
  • David C. Joy
    • 4
  • Charles Fiori
    • 5
  • Eric Lifshin
    • 6
  1. 1.Lehigh UniversityBethlehemUSA
  2. 2.National Bureau of StandardsUSA
  3. 3.University of CambridgeCambridgeEngland
  4. 4.Bell LaboratoriesMurray HillUSA
  5. 5.National Institutes of HealthBethesdaUSA
  6. 6.General Electric Corporate Research and DevelopmentSchenectadyUSA

Bibliographic information

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