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VLSI Design for Manufacturing: Yield Enhancement

  • Stephen W. Director
  • Wojciech Maly
  • Andrzej J. Strojwas

Table of contents

  1. Front Matter
    Pages i-xii
  2. Stephen W. Director, Wojciech Maly, Andrzej J. Strojwas
    Pages 1-42
  3. Stephen W. Director, Wojciech Maly, Andrzej J. Strojwas
    Pages 43-91
  4. Stephen W. Director, Wojciech Maly, Andrzej J. Strojwas
    Pages 93-128
  5. Stephen W. Director, Wojciech Maly, Andrzej J. Strojwas
    Pages 129-173
  6. Stephen W. Director, Wojciech Maly, Andrzej J. Strojwas
    Pages 175-228
  7. Stephen W. Director, Wojciech Maly, Andrzej J. Strojwas
    Pages 229-267
  8. Back Matter
    Pages 269-291

About this book

Introduction

One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufacturing process and by designing the process and the circuits in such a way as to minimize the effect of the inherent variations of the process on performance. The latter is typically referred to as "design for manufacture" or "statistical design". As device sizes continue to shrink, the effects of the inherent fluctuations in the IC fabrication process will have an even more obvious effect on circuit performance. And design for manufacture will increase in importance. We have been working in the area of statistically based computer aided design for more than 13 years. During the last decade we have been working with each other, and individually with our students, to develop methods and CAD tools that can be used to improve yield during the design and manufacturing phases of IC realization. This effort has resulted in a large number of publications that have appeared in a variety of journals and conference proceedings. Thus our motivation in writing this book is to put, in one place, a description of our approach to IC yield enhancement. While the work that is contained in this book has appeared in the open literature, we have attempted to use a consistent notation throughout this book.

Keywords

PROM Phase Software VLSI computer integrated circuit manufacturing model modeling production simulation transistor

Authors and affiliations

  • Stephen W. Director
    • 1
  • Wojciech Maly
    • 1
  • Andrzej J. Strojwas
    • 1
  1. 1.Carnegie Mellon UniversityUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4613-1521-6
  • Copyright Information Springer-Verlag US 1990
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4612-8816-9
  • Online ISBN 978-1-4613-1521-6
  • Series Print ISSN 0893-3405
  • Buy this book on publisher's site
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