Handbook of Iris Recognition

  • Mark J. Burge
  • Kevin W. Bowyer

Part of the Advances in Computer Vision and Pattern Recognition book series (ACVPR)

Table of contents

  1. Front Matter
    Pages i-xvi
  2. Kevin W. Bowyer, Mark J. Burge
    Pages 1-14
  3. Kevin W. Bowyer, Karen P. Hollingsworth, Patrick J. Flynn
    Pages 15-54
  4. George Quinn, Patrick Grother, Elham Tabassi
    Pages 55-66
  5. Natalia A. Schmid, Jinyu Zuo, Francesco Nicolo, Harry Wechsler
    Pages 67-84
  6. P. Jonathon Phillips, Patrick J. Flynn
    Pages 85-102
  7. Algirdas Bastys, Justas Kranauskas, Volker Krüger
    Pages 103-127
  8. Antwan D. Clark, Scott A. Kulp, Isom H. Herron, A. A. Ross
    Pages 129-150
  9. Hugo Proença
    Pages 151-169
  10. Mark J. Burge, Matthew Monaco
    Pages 171-181
  11. Jaishanker K. Pillai, Vishal M. Patel, Rama Chellappa, Nalini K. Ratha
    Pages 183-204
  12. Sarah E. Baker, Kevin W. Bowyer, Patrick J. Flynn, P. Jonathon Phillips
    Pages 205-218
  13. Ryan Connaughton, Kevin W. Bowyer, Patrick J. Flynn
    Pages 219-237
  14. Raghavender Jillela, Arun A. Ross
    Pages 239-279
  15. Raghavender Jillela, Arun A. Ross, Vishnu Naresh Boddeti, B. V. K. Vijaya Kumar, Xiaofei Hu, Robert Plemmons et al.
    Pages 281-308
  16. Josh Klontz, Mark J. Burge
    Pages 309-319
  17. Adams Wai Kin Kong, David Zhang, Mohamed Kamel
    Pages 321-336
  18. B. V. K. Kumar, Jason Thornton, Marios Savvides, Vishnu Naresh Boddeti, Jonathon M. Smereka
    Pages 337-354
  19. Shreyas Venugopalan, Marios Savvides
    Pages 355-366
  20. David A. Ackerman
    Pages 367-393
  21. Back Matter
    Pages 395-407

About this book


More than 100 trillion iris comparisons are now being performed on a daily basis, a number that is rapidly growing. This is breath-taking progress for a field that is arguably just twenty years old.

The first book of its kind devoted entirely to the subject, the Handbook of Iris Recognition introduces the reader to this exciting, rapidly developing, technology of today and tomorrow. Blending insights from the editors’ own work, and exploiting their broad overview of the field, this authoritative collection introduces the reader to the state of the art in iris recognition technology.

Topics and features:

  • With a Foreword by the “father of iris recognition,” Professor John Daugman of Cambridge University
  • Presents work from an international selection of preeminent researchers, reflecting the uses of iris recognition in many different social contexts
  • Provides viewpoints from researchers in government, industry and academia, highlighting how iris recognition is both a thriving industry and an active research area
  • Surveys previous developments in the field, and covers topics ranging from the low-level (e.g., physics of iris image acquisition) to the high level (e.g., alternative non-Daugman approaches to iris matching)
  • Introduces many active and open areas of research in iris recognition, including cross-wavelength matching and iris template aging

This comprehensive text/reference is an essential resource for anyone wishing to improve their understanding of iris recognition technology, be they practitioners in industry, managers and executives, or researchers searching for new insights and ideas.

Dr. Mark J. Burge is Senior Principal Scientist at the MITRE Corporation, McLean, VA, USA. Dr. Kevin W. Bowyer is the Schubmehl-Prein Family Professor and Department Chair of Computer Science and Engineering at the University of Notre Dame, IN, USA.


Biometrics Computer Vision Image Processing Iris Recognition Pattern Recognition

Editors and affiliations

  • Mark J. Burge
    • 1
  • Kevin W. Bowyer
    • 2
  1. 1.MITRE CorporationMcLeanUSA
  2. 2., Department of Computer Science and EnginUniversity of Notre DameNotre DameUSA

Bibliographic information

  • DOI
  • Copyright Information Springer-Verlag London 2013
  • Publisher Name Springer, London
  • eBook Packages Computer Science
  • Print ISBN 978-1-4471-4401-4
  • Online ISBN 978-1-4471-4402-1
  • Series Print ISSN 2191-6586
  • Series Online ISSN 2191-6594
  • Buy this book on publisher's site
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